Advances in electronics and electron physics. Volume 78 /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boston : Academic Press, �1990.
Colección:Advances in electronics and electron physics ; v. 78
Temas:
Electronics.
Electrons.
Scanning electron microscopes.
Silicon.
�Electronique.
�Electrons.
Microscopes �electroniques �a balayage.
Silicium.
electronic engineering.
silicon.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
Electronics
Electrons
Scanning electron microscopes
Silicon
Acceso en línea:Texto completo
Texto completo
Tabla de Contenidos:
  • Theory of the gaseous detector device in the ESEM / G.D. Danilatos--Carrier transport in bulk silicon and weak silicon inversion layers / S.C. Jain, K.H. Winters, and R. van Overstraeten--Emission-imaging electron-optical system design / V.P. Il�in [and others].

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