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Advances in electronics and electron physics. Volume 78 /

Detalles Bibliográficos
Clasificación:	Libro Electrónico
Otros Autores:	Hawkes, P. W.
Formato:	Electrónico eBook
Idioma:	Inglés
Publicado:	Boston : Academic Press, �1990.
Colección:	Advances in electronics and electron physics ; v. 78
Temas:	Electronics. Electrons. Scanning electron microscopes. Silicon. �Electronique. �Electrons. Microscopes �electroniques �a balayage. Silicium. electronic engineering. silicon. TECHNOLOGY & ENGINEERING > Electronics > Microelectronics. TECHNOLOGY & ENGINEERING > Electronics > Digital. Electronics Electrons Scanning electron microscopes Silicon
Acceso en línea:	Texto completo Texto completo

Tabla de Contenidos:

Theory of the gaseous detector device in the ESEM / G.D. Danilatos--Carrier transport in bulk silicon and weak silicon inversion layers / S.C. Jain, K.H. Winters, and R. van Overstraeten--Emission-imaging electron-optical system design / V.P. Il�in [and others].