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Three-dimensional integrated circuit design /

With vastly increased complexity and functionality in the "nanometer era" (i.e. hundreds of millions of transistors on one chip), increasing the performance of integrated circuits has become a challenging task. This is due primarily to the inevitable increase in the distance among circuit...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Pavlidis, Vasilis F., 1976-
Otros Autores: Friedman, Eby G.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam ; Boston : Morgan Kaufmann, �2009.
Colección:Morgan Kaufmann series in systems on silicon.
Temas:
Acceso en línea:Texto completo

MARC

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100 1 |a Pavlidis, Vasilis F.,  |d 1976- 
245 1 0 |a Three-dimensional integrated circuit design /  |c Vasilis F. Pavlidis, Eby G. Friedman. 
260 |a Amsterdam ;  |a Boston :  |b Morgan Kaufmann,  |c �2009. 
300 |a 1 online resource (xv, 309 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a The Morgan Kaufmann series in systems on silicon 
520 |a With vastly increased complexity and functionality in the "nanometer era" (i.e. hundreds of millions of transistors on one chip), increasing the performance of integrated circuits has become a challenging task. This is due primarily to the inevitable increase in the distance among circuit elements and interconnect design solutions have become the greatest determining factor in overall performance. 
505 0 |a Chapter 1. Introduction -- Chapter 2. Manufacturing of 3-D Packaged Systems -- Chapter 3. 3-D Integrated Circuit Fabrication Technologies -- Chapter 4. Interconnect Prediction Models -- Chapter 5. Physical Design Techniques for 3-D ICs -- Chapter 6. Thermal Management Techniques -- Chapter 7. Timing Optimization for Two-Terminal Interconnects -- Chapter 8. Timing Optimization for Multi-Terminal Interconnects -- Appendix A: Enumeration of Gate Pairs in a 3-D IC --Appendix B: Formal Proof of Optimum Single Via Placement -- Appendix C: Proof of the Two-Terminal Via Placement Heuristic -- Appendix D: Proof of Condition for Via Placement of Multi-Terminal Nets -- References. 
504 |a Includes bibliographical references (pages 289-303) and index. 
588 0 |a Print version record. 
650 0 |a Integrated circuits  |x Design and construction. 
650 6 |a Circuits int�egr�es  |x Conception et construction.  |0 (CaQQLa)201-0363604 
650 7 |a TECHNOLOGY & ENGINEERING  |x Electronics  |x Circuits  |x Integrated.  |2 bisacsh 
650 7 |a TECHNOLOGY & ENGINEERING  |x Electronics  |x Circuits  |x General.  |2 bisacsh 
650 7 |a Integrated circuits  |x Design and construction.  |2 fast  |0 (OCoLC)fst00975545 
700 1 |a Friedman, Eby G. 
776 0 8 |i Print version:  |a Pavlidis, Vasilis F., 1976-  |t Three-dimensional integrated circuit design.  |d Amsterdam ; Boston : Morgan Kaufmann, �2009  |z 9780123743435  |z 0123743435  |w (OCoLC)228364680 
830 0 |a Morgan Kaufmann series in systems on silicon. 
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