Advances in imaging and electron physics. Volume 109 /

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics a...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Diego : Academic Press, �1999.
Colección:Advances in imaging and electron physics ; v. 109
Temas:
Electrons.
Electron microscopes.
Image processing.
Electronics.
�Electrons.
Microscopes �electroniques.
Traitement d'images.
�Electronique.
image processing.
electronic engineering.
SCIENCE > Physics > Electromagnetism.
SCIENCE > Physics > Electricity.
Electron microscopes
Electronics
Electrons
Image processing
Acceso en línea:Texto completo
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Tabla de Contenidos:
  • Front Cover; Advances in Imaging and Electron Physics, Volume 109; Copyright Page; Contents; Contributors; Preface; Forthcoming Contributors; Chapter 1. Development and Applications of a New Deep Level Transient Spectroscopy Method and New Averaging Techniques; I. Introduction; II. Review of the Deep-Level Transient Spectroscopy Method; III. Averaging and Recording of Digital DLTS Transient Signals; IV. Feedback Circuits and Experimental Setup for CC-DLTS and CR-DLTS; V. Constant-Resistance DLTS in Enhancement Mode MOSFETs; VI. Constant-Resistance DLTS in Depletion Mode MOSFETs
  • VII. Constant-Resistance DLTS in Junction Field-Effect TransistorsVIII. Conclusions and Areas for Future Research; References; Appendix A: Magnitude Errors; Appendix B: Time Constant Errors; Appendix C: Noise Sources and Signal-to-Noise Ratio (SNR) in the DLTS Transients; Appendix D: Electrical Circuit of the Pseudo-Logarithmic Generator; Appendix E: Electrical Circuits of the Feedback Circuit; Appendix F: Listing of a Template for a DLTS Measurement Program; Appendix G: Listing of a Template for a DLTS Analysis Program; Appendix H: Radiation-Induced Defects in Silicon; List of Acronyms
  • List of SymbolsChapter 2. Complex Dyadic Multiresolution Analyses; I. Introduction; II. The Spline Example; III. Multiresolution and Wavelet; IV. Daubechies' Wavelets; V. Symmetric Daubechies Wavelets; VI. The Phase of SDW Scaling Function; VII. The Mallat Algorithm with Complex Filters; VIII. Restoration from the Phase; IX. lmage Enhancement; X. Complex Shrinkage; XI. Conclusion; References; Reading List; Chapter 3. Lattice Vector Quantization for Wavelet-Based Image Coding; I. Introduction; II. Quantization of Wavelet Coefficients; III. Lattice Quantization Fundamentals; IV. Lattices
  • v. Quantization Algorithms for Selected LatticesVI. Counting the Lattice Points; VII. Scaling Algorithm; VIII. Selecting a Lattice for Quantization; IX. Entropy Coding of Lattice Vectors; X. Experimental Results; XI. Conclusions; Appendix A: Cartan Matrices of Some Root Systems; References; Chapter 4. Fuzzy Cellular Neural Networks and Their Applications to Image Processing; I. Introduction; II. Fuzzy Cellular Neural Networks; III. Theory of Fuzzy Cellular Neural Networks; IV. FCNN as Computational Arrays; V. Embed Linguistic Statements into FCNN; VI. Learning Algorithms of FCNN
  • VII. Generic Algorithm for FCNNVIII. Applications of Discrete-Time FCNN; IX. Conclusions and Future Work; References; Index

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