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Advances in imaging and electron physics. Volume 109 /
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics a...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Diego :
Academic Press,
�1999.
|
| Colección: | Advances in imaging and electron physics ;
v. 109 |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
MARC
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| 050 | 4 | |a QC793.5.E62 |b A37eb vol. 109 | |
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| 082 | 0 | 4 | |a 537.5 |2 22 |
| 245 | 0 | 0 | |a Advances in imaging and electron physics. |n Volume 109 / |c edited by Peter Hawkes. |
| 260 | |a San Diego : |b Academic Press, |c �1999. | ||
| 300 | |a 1 online resource (xvi, 453 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 0 | |a Advances in imaging and electron physics ; |v v. 109 | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 520 | |a Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. | ||
| 505 | 0 | |a Front Cover; Advances in Imaging and Electron Physics, Volume 109; Copyright Page; Contents; Contributors; Preface; Forthcoming Contributors; Chapter 1. Development and Applications of a New Deep Level Transient Spectroscopy Method and New Averaging Techniques; I. Introduction; II. Review of the Deep-Level Transient Spectroscopy Method; III. Averaging and Recording of Digital DLTS Transient Signals; IV. Feedback Circuits and Experimental Setup for CC-DLTS and CR-DLTS; V. Constant-Resistance DLTS in Enhancement Mode MOSFETs; VI. Constant-Resistance DLTS in Depletion Mode MOSFETs | |
| 505 | 8 | |a VII. Constant-Resistance DLTS in Junction Field-Effect TransistorsVIII. Conclusions and Areas for Future Research; References; Appendix A: Magnitude Errors; Appendix B: Time Constant Errors; Appendix C: Noise Sources and Signal-to-Noise Ratio (SNR) in the DLTS Transients; Appendix D: Electrical Circuit of the Pseudo-Logarithmic Generator; Appendix E: Electrical Circuits of the Feedback Circuit; Appendix F: Listing of a Template for a DLTS Measurement Program; Appendix G: Listing of a Template for a DLTS Analysis Program; Appendix H: Radiation-Induced Defects in Silicon; List of Acronyms | |
| 505 | 8 | |a List of SymbolsChapter 2. Complex Dyadic Multiresolution Analyses; I. Introduction; II. The Spline Example; III. Multiresolution and Wavelet; IV. Daubechies' Wavelets; V. Symmetric Daubechies Wavelets; VI. The Phase of SDW Scaling Function; VII. The Mallat Algorithm with Complex Filters; VIII. Restoration from the Phase; IX. lmage Enhancement; X. Complex Shrinkage; XI. Conclusion; References; Reading List; Chapter 3. Lattice Vector Quantization for Wavelet-Based Image Coding; I. Introduction; II. Quantization of Wavelet Coefficients; III. Lattice Quantization Fundamentals; IV. Lattices | |
| 505 | 8 | |a v. Quantization Algorithms for Selected LatticesVI. Counting the Lattice Points; VII. Scaling Algorithm; VIII. Selecting a Lattice for Quantization; IX. Entropy Coding of Lattice Vectors; X. Experimental Results; XI. Conclusions; Appendix A: Cartan Matrices of Some Root Systems; References; Chapter 4. Fuzzy Cellular Neural Networks and Their Applications to Image Processing; I. Introduction; II. Fuzzy Cellular Neural Networks; III. Theory of Fuzzy Cellular Neural Networks; IV. FCNN as Computational Arrays; V. Embed Linguistic Statements into FCNN; VI. Learning Algorithms of FCNN | |
| 505 | 8 | |a VII. Generic Algorithm for FCNNVIII. Applications of Discrete-Time FCNN; IX. Conclusions and Future Work; References; Index | |
| 546 | |a English. | ||
| 650 | 0 | |a Electrons. | |
| 650 | 0 | |a Electron microscopes. | |
| 650 | 0 | |a Image processing. | |
| 650 | 0 | |a Electronics. | |
| 650 | 6 | |a �Electrons. |0 (CaQQLa)201-0004714 | |
| 650 | 6 | |a Microscopes �electroniques. |0 (CaQQLa)201-0014917 | |
| 650 | 6 | |a Traitement d'images. |0 (CaQQLa)201-0029952 | |
| 650 | 6 | |a �Electronique. |0 (CaQQLa)201-0001759 | |
| 650 | 7 | |a image processing. |2 aat |0 (CStmoGRI)aat300237864 | |
| 650 | 7 | |a electronic engineering. |2 aat |0 (CStmoGRI)aat300253978 | |
| 650 | 7 | |a SCIENCE |x Physics |x Electromagnetism. |2 bisacsh | |
| 650 | 7 | |a SCIENCE |x Physics |x Electricity. |2 bisacsh | |
| 650 | 7 | |a Electron microscopes |2 fast |0 (OCoLC)fst00906679 | |
| 650 | 7 | |a Electronics |2 fast |0 (OCoLC)fst00907538 | |
| 650 | 7 | |a Electrons |2 fast |0 (OCoLC)fst00907642 | |
| 650 | 7 | |a Image processing |2 fast |0 (OCoLC)fst00967501 | |
| 700 | 1 | |a Hawkes, P. W. | |
| 776 | 0 | 8 | |i Print version: |t Advances in imaging and electron physics. Volume 109. |d San Diego : Academic Press, �1999 |z 0120147513 |z 9780120147519 |w (OCoLC)42214780 |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780120147519 |z Texto completo |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/bookseries/10765670/109 |z Texto completo |