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Advances in imaging and electron physics. Volume 110 /
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics a...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Diego :
Academic Press,
�1999.
|
| Colección: | Advances in imaging and electron physics ;
v. 110 |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
MARC
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| 245 | 0 | 0 | |a Advances in imaging and electron physics. |n Volume 110 / |c edited by Peter W. Hawkes. |
| 260 | |a San Diego : |b Academic Press, |c �1999. | ||
| 300 | |a 1 online resource (xiv, 178 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 0 | |a Advances in imaging and electron physics ; |v v. 110 | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 520 | |a Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. | ||
| 505 | 0 | |a Front Cover; Advances in Imaging and Electron Physics, Volume 110; Copyright Page; CONTENTS; Contributors; Preface; Forthcoming Contributors; Chapter 1. Interference Scanning Optical Probe Microscopy: Principles and Applications; I. Introduction: Wave Optical Properties Near Surfaces; II. Outline; III. The Microscopic Perspective of Light-Matter Interaction: Wave Scattering; IV. Formation of Standing Waves: Propagative and Nonpropagative Waves; V. Imaging of Standing Waves: Shadow Formation and Detection through Probe Edge | |
| 505 | 8 | |a VI. Quantum Limit in Near-Field Imaging: Short versus Intermediate Distance ObservationVII. Near-Field Holography: Amplitude and Phase Information; VIII. Experimental Results; IX. Concluding Remarks; Chapter 2. High-speed Electron Microscopy; I. Introduction; II. High-Speed Techniques; III. Time-Resolving Microscopes; IV. Concluding Remarks; Acknowledgments; References; Chapter 3. Soft Mathematical Morphology: Extensions, Algorithms, and Implementations; I. Introduction; II. Standard Mathematical Morphology; III. Soft Mathematical Morphology | |
| 505 | 8 | |a IV. Soft Morphological Structuring Element DecompositionV. Fuzzy Soft Mathematical Morphology; VI. Implementations; VII. Concluding Remarks; References; Chapter 4. Difference in the Aharonov-Bohm Effect on Scattering States and Bound States; I. Introduction; II. AB Effect on Scattering States; III. AB Effect on Bound States; IV. AB Effect on a System of Both Bound States and Scattering States; V. Gauge Invariance and Scattering Theory; VI. Concluding Remarks; Acknowledgments; Index | |
| 546 | |a English. | ||
| 650 | 0 | |a Electrons. | |
| 650 | 0 | |a Electron microscopes. | |
| 650 | 0 | |a Image processing. | |
| 650 | 0 | |a Electronics. | |
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| 650 | 6 | |a Microscopes �electroniques. |0 (CaQQLa)201-0014917 | |
| 650 | 6 | |a Traitement d'images. |0 (CaQQLa)201-0029952 | |
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| 650 | 7 | |a SCIENCE |x Physics |x Electricity. |2 bisacsh | |
| 650 | 7 | |a Electron microscopes |2 fast |0 (OCoLC)fst00906679 | |
| 650 | 7 | |a Electronics |2 fast |0 (OCoLC)fst00907538 | |
| 650 | 7 | |a Electrons |2 fast |0 (OCoLC)fst00907642 | |
| 650 | 7 | |a Image processing |2 fast |0 (OCoLC)fst00967501 | |
| 700 | 1 | |a Hawkes, P. W. | |
| 776 | 0 | 8 | |i Print version: |t Advances in imaging and electron physics. Volume 110. |d San Diego : Academic Press, �1999 |z 0120147521 |z 9780120147526 |w (OCoLC)42214777 |
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| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/bookseries/10765670/110 |z Texto completo |