Advances in imaging and electron physics. Volume 105 /

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics a...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Diego ; London : Academic Press, �1999.
Colección:Advances in imaging and electron physics.
Temas:
Electrons.
Electron microscopes.
Image processing.
Electronics.
Electrons
Electronics
�Electrons.
Microscopes �electroniques.
Traitement d'images.
�Electronique.
image processing.
SCIENCE > Physics > Electromagnetism.
SCIENCE > Physics > Electricity.
Electron microscopes
Image processing
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MARC

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245 0 0 |a Advances in imaging and electron physics.  |n Volume 105 /  |c edited by Peter W. Hawkes. 
260 |a San Diego ;  |a London :  |b Academic Press,  |c �1999. 
300 |a 1 online resource (xiii, 416 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
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490 1 |a Advances in imaging and electron physics ;  |v v. 105 
504 |a Includes bibliographical references and index. 
588 0 |a Print version record. 
520 |a Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. 
505 0 |a Front Cover; Advances in Imaging and Electron Physics, Volume 105; Copyright Page; Contents; Contributors; Preface; Chapter 1. Near-Sensor Image Processing; I. Introduction; II. A Near-Sensor Image Processor; III. Near-Sensor Image Processing Algorithms; IV. Adaptive Thresholding; V. Variable Sampling Time; VI. Grayscale Morphology; VII. Linear Convolution; VIII. A 2D NSIP Model; IX. Global Operations; X. Feature Extraction; XI. An NSIP System; XII. Sheet-of-Light Range Images; XIII. Conclusion; Acknowledgment; References. 
505 8 |a Chapter 2. Digital Image Processing Technology for Scanning Electron MicroscopyI. Introduction; II. Proper Acquisition and Handling of SEM Image; III. Quality Improvement of SEM Images; IV. Image Measurement and Analysis; V. SEM Parameters Measurement; VI. Color SEM Image; VII. Automatic Focusing and Astigmatism Correction; VIII. Remote Control of SEM; IX. Active Image Processing; References; Chapter 3. Design and Performance of Shadow-Mask Color Cathode Ray Tubes; I. Introduction; II. Basic Structure of Shadow-Mask Tube and Principle of Operation; III. Alternative Gun and Screen Arrangements. 
505 8 |a IV. Geometric ConsiderationsV. Shadow Masks; VI. Phosphor Materials and Screen Fabrication; VII. Deflection; VIII. Glass Bulbs; IX. Reduction of Screen Curvature and Use of Flat Tension Masks; X. Contrast Enhancement; XI. Moire; XII. Shadow-Mask Tubes for High-Resolution Display Applications; XIII. Human Factors and Health Considerations; XIV. Concluding Remarks; Acknowledgment; Appendix: Some Specifications of Representative Tube Types; References; Chapter 4. Electron Gun Systems for Color Cathode Ray Tubes; I. Historical Introduction. 
505 8 |a II. Electron Beam Formation and Factors Limiting Current Density of SpotIII. Electron Gun Designs; IV. Cathodes; V. Techniques for Improving High-Tension Stability; Acknowledgment; References; Index. 
546 |a English. 
650 0 |a Electrons. 
650 0 |a Electron microscopes. 
650 0 |a Image processing. 
650 0 |a Electronics. 
650 2 |a Electrons  |0 (DNLM)D004583 
650 2 |a Electronics  |0 (DNLM)D004581 
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650 6 |a Traitement d'images.  |0 (CaQQLa)201-0029952 
650 6 |a �Electronique.  |0 (CaQQLa)201-0001759 
650 7 |a image processing.  |2 aat  |0 (CStmoGRI)aat300237864 
650 7 |a SCIENCE  |x Physics  |x Electromagnetism.  |2 bisacsh 
650 7 |a SCIENCE  |x Physics  |x Electricity.  |2 bisacsh 
650 7 |a Electron microscopes  |2 fast  |0 (OCoLC)fst00906679 
650 7 |a Electronics  |2 fast  |0 (OCoLC)fst00907538 
650 7 |a Electrons  |2 fast  |0 (OCoLC)fst00907642 
650 7 |a Image processing  |2 fast  |0 (OCoLC)fst00967501 
700 1 |a Hawkes, P. W. 
776 0 8 |i Print version:  |t Advances in imaging and electron physics. Volume 105.  |d San Diego ; London : Academic Press, �1999  |z 0120147475  |z 9780120147472  |w (OCoLC)40756705 
830 0 |a Advances in imaging and electron physics. 
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