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Advances in imaging and electron physics. Volume 103 /
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hi...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Diego ; London :
Academic Press,
�1998.
|
| Colección: | Advances in imaging and electron physics ;
v. 103 |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
MARC
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| 245 | 0 | 0 | |a Advances in imaging and electron physics. |n Volume 103 / |c edited by Peter W. Hawkes. |
| 260 | |a San Diego ; |a London : |b Academic Press, |c �1998. | ||
| 300 | |a 1 online resource (xi, 398 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 0 | |a Advances in imaging and electron physics ; |v v. 103 | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 520 | |a Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. | ||
| 505 | 0 | |a Front Cover; Advances in Imaging and Electron Physics, Volume 103; Copyright Page; Contents; Contributors; Preface; Chapter 1. Space-Time Representation of Ultra Wideband Signals; I. Introduction and Outline; II. Time-Harmonic Radiation from an Aperture; III. Time-Domain Representation of Radiation from an Aperture; IV. Illustrative Example; V. Wavepackets and Pulsed Beams in a Unifom Medium; VI. Phase-Space Pulsed Beam Analysis for Time-Dependent Radiation from Extended Apertures; Appendix: Asymptotic Evaluation of the Beam Field in (125); References; Chapter 2. The Structure of Relief | |
| 505 | 8 | |a I. IntroductionII. The Differential Structure of Images; III. Global Description of the Relief; IV. Contours: Envelopes of the Level Curves; V. Discrete Representation; VI. Conclusion; References; Chapter 3. Dyadic Green's Function Microstrip Circulator Theory for Inhomogeneous Ferrite With and Without Penetrable Walls; I. Overall Introduction; II. Implicit 3D Dyadic Green's Function with Vertically Layered External Material Using Mode-Matching; III. Implicit 3D Dyadic Green's Function with Simple External Material Using Mode-Matching; IV. 2D Dyadic Green's Function for Penetrable Walls | |
| 505 | 8 | |a v. 3D Dyadic Green's Function for Penetrable WallsVI. Limiting Dyadic Green's Function Forms for Homogeneous Ferrite; VII. Symmetry Considerations for Hard Magnetic Wall Circulators; VIII. Overall Conclusion; References; Chapter 4. Charged Particle Optics of Systems with Narrow Gaps: A Perturbation Theory Approach; I. Introduction; II. Applicability of Perturbation Methods in Charged Particle Optics; III. Calculation of Weakly Distorted Sector Fields and Their Properties with the Aidofa Direct Substitution Method | |
| 505 | 8 | |a IV. Transformation of Charged Particle Trajectories in the Narrow Transition Regions Between Electron- and Ion-Optical ElementsV. Synthesis of Required Field Characteristics in Sector Energy Analyzers and Wien Filters with the Aid of Terminating Electrodes; VI. Calculation of the Elements of Spectrometers for Simultaneous Angular and Energy or Mass Analysis of Charged Particles; VII. Conclusion; Acknowledgments; References; Index | |
| 546 | |a English. | ||
| 650 | 0 | |a Electrons. | |
| 650 | 0 | |a Electron microscopes. | |
| 650 | 0 | |a Image processing. | |
| 650 | 0 | |a Electronics. | |
| 650 | 6 | |a �Electrons. |0 (CaQQLa)201-0004714 | |
| 650 | 6 | |a Microscopes �electroniques. |0 (CaQQLa)201-0014917 | |
| 650 | 6 | |a Traitement d'images. |0 (CaQQLa)201-0029952 | |
| 650 | 6 | |a �Electronique. |0 (CaQQLa)201-0001759 | |
| 650 | 7 | |a image processing. |2 aat |0 (CStmoGRI)aat300237864 | |
| 650 | 7 | |a electronic engineering. |2 aat |0 (CStmoGRI)aat300253978 | |
| 650 | 7 | |a SCIENCE |x Physics |x Electromagnetism. |2 bisacsh | |
| 650 | 7 | |a SCIENCE |x Physics |x Electricity. |2 bisacsh | |
| 650 | 7 | |a Electron microscopes |2 fast |0 (OCoLC)fst00906679 | |
| 650 | 7 | |a Electronics |2 fast |0 (OCoLC)fst00907538 | |
| 650 | 7 | |a Electrons |2 fast |0 (OCoLC)fst00907642 | |
| 650 | 7 | |a Image processing |2 fast |0 (OCoLC)fst00967501 | |
| 650 | 7 | |a Images, traitement des. |2 ram | |
| 650 | 7 | |a Infographie. |2 ram | |
| 700 | 1 | |a Hawkes, P. W. | |
| 776 | 0 | 8 | |i Print version: |t Advances in imaging and electron physics. Volume 103. |d San Diego ; London : Academic Press, �1998 |z 0120147459 |z 9780120147458 |w (OCoLC)39861835 |
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| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/bookseries/10765670/103 |z Texto completo |