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The spectroscopy of semiconductors /
Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic techniques used to investigate bulk and artificially structured semiconductors including: photoluminescence, photo-reflectance,...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Boston :
Academic Press,
�1992.
|
| Colección: | Semiconductors and semimetals ;
v. 36. |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
MARC
| LEADER | 00000cam a2200000 a 4500 | ||
|---|---|---|---|
| 001 | SCIDIR_ocn298460502 | ||
| 003 | OCoLC | ||
| 005 | 20231117015203.0 | ||
| 006 | m o d | ||
| 007 | cr cnu---unuuu | ||
| 008 | 090115s1992 maua ob 001 0 eng d | ||
| 040 | |a N$T |b eng |e pn |c N$T |d OCLCQ |d OCLCE |d IDEBK |d E7B |d OCLCQ |d OPELS |d OCLCQ |d OCLCF |d YDXCP |d EBLCP |d OCLCQ |d DEBSZ |d OCLCQ |d MERUC |d OCLCQ |d LEAUB |d OCLCQ |d VLY |d OCLCO |d OCLCQ | ||
| 019 | |a 300984380 |a 646758670 |a 808733743 |a 1162073930 | ||
| 020 | |a 9780080864334 |q (electronic bk.) | ||
| 020 | |a 0080864333 |q (electronic bk.) | ||
| 020 | |a 0127521364 |q (electronic bk.) | ||
| 020 | |a 9780127521367 |q (electronic bk.) | ||
| 020 | |a 1281760218 | ||
| 020 | |a 9781281760210 | ||
| 020 | |a 9786611760212 | ||
| 020 | |a 6611760210 | ||
| 035 | |a (OCoLC)298460502 |z (OCoLC)300984380 |z (OCoLC)646758670 |z (OCoLC)808733743 |z (OCoLC)1162073930 | ||
| 050 | 4 | |a QC610.9 |b .S48eb vol. 36 | |
| 072 | 7 | |a SCI |x 021000 |2 bisacsh | |
| 082 | 0 | 4 | |a 537.6/22 |2 22 |
| 245 | 0 | 4 | |a The spectroscopy of semiconductors / |c volume editors, David G. Seiler, Christopher L. Littler. |
| 260 | |a Boston : |b Academic Press, |c �1992. | ||
| 300 | |a 1 online resource (xiii, 435 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Semiconductors and semimetals ; |v v. 36 | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 520 | |a Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic techniques used to investigate bulk and artificially structured semiconductors including: photoluminescence, photo-reflectance, inelastic light scattering, magneto-optics, ultrafast work, piezo-spectroscopy methods, and spectroscopy at extremely low temperatures and high magnetic fields. Emphasis is given to major semiconductor systems, and artificially structured materials such as GaAs, InSb, Hg1-xCdxTe and MBE grown structures based upon GaAs/AlGaAs materials. Both the spectroscopic novice and the expert will benefit from the descriptions and discussions of the methods, principles, and applications relevant to today's semiconductor structures. Key Features * Discusses the latest advances in spectroscopic techniques used to investigate bulk and artificially structured semiconductors * Features detailed review articles which cover basic principles * Highlights specific applications such as the use of laser spectroscopy for the characterization of GaAs quantum well structures. | ||
| 505 | 0 | |a Front Cover; The Spectroscopy of Semiconductors; Copyright Page; Contents; List of Contributors; Preface; Chapter 1. Laser Spectroscopy of Semiconductors at Low Temperatures and High Magnetic Fields; I. Introduction; II. Experimental Techniques; III. GaAs Quantum Well Structures; IV. Magnetic Semiconductors; Acknowledgments; References; Chapter 2. Transient Spectroscopy by Ultrashort Laser Pulse Techniques; I. Introduction; II. Instrumentation for Time-Resolved Spectroscopy; III. Time-Resolved Spectroscopy in Semiconductors: Approaches. | |
| 505 | 8 | |a IV. Portfolio of Experimental Examples in Time-Resolved SpectroscopyV. Concluding Remarks; References; Chapter 3. Piezospectroscopy of Semiconductors; I. Introduction; II. Elasticity, Symmetry, Latent Anisotropy, and Deformation Potentials.; III. Experimental Techniques; IV. Valence and Conduction Bands of Elemental and Compound Semiconductors under External Stress; V. Interband Transitions and Associated Excitons; VI. Lyman Spectra of Shallow Donors and Acceptors; VII. Zone-Center Optical Phonons; VIII. Optical Phonons and Electronic States; IX. Concluding Remarks; Acknowledgments. | |
| 546 | |a English. | ||
| 650 | 0 | |a Semiconductors |x Optical properties. | |
| 650 | 0 | |a Spectrum analysis. | |
| 650 | 6 | |a Semi-conducteurs |x Propri�et�es optiques. |0 (CaQQLa)201-0318268 | |
| 650 | 7 | |a SCIENCE |x Physics |x Electricity. |2 bisacsh | |
| 650 | 7 | |a Semiconductors |x Optical properties. |2 fast |0 (OCoLC)fst01112243 | |
| 650 | 7 | |a Spectrum analysis. |2 fast |0 (OCoLC)fst01129108 | |
| 700 | 1 | |a Seiler, David G. | |
| 700 | 1 | |a Littler, C. L. | |
| 776 | 0 | 8 | |i Print version: |t Spectroscopy of semiconductors. |d Boston : Academic Press, �1992 |z 0127521364 |z 9780127521367 |w (OCoLC)26222772 |
| 830 | 0 | |a Semiconductors and semimetals ; |v v. 36. | |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780127521367 |z Texto completo |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/bookseries/00808784/36 |z Texto completo |