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Imperfections in III/V materials /

SEMICONDUCTORS & amp; SEMIMETALS V38.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Weber, Eicke R.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boston : Academic Press, �1993.
Colección:Semiconductors and semimetals ; v. 38.
Temas:
Acceso en línea:Texto completo
Texto completo

MARC

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245 0 0 |a Imperfections in III/V materials /  |c volume editor, Eicke R. Weber. 
260 |a Boston :  |b Academic Press,  |c �1993. 
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490 1 |a Semiconductors and semimetals ;  |v v. 38 
504 |a Includes bibliographical references and index. 
588 0 |a Print version record. 
506 |3 Use copy  |f Restrictions unspecified  |2 star  |5 MiAaHDL 
533 |a Electronic reproduction.  |b [Place of publication not identified] :  |c HathiTrust Digital Library,  |d 2010.  |5 MiAaHDL 
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505 0 |a Front Cover; Imperfections in III/V Materials; Copyright Page; Contents; List of Contributors; Preface; Chapter 1. Density-Functional Theory of sp-Bonded Defects in III/V Semiconductors; I. Introduction; II. Thermodynamics of Defects in Semiconductors; III. Ab-lnitio Calculation of the Electronic Ground State and of Atomic Vibrations; IV. Methods and Techniques; V. Electronic Structures and Concentrations of Native Defects; VI. An Intrinsic Metastability of Antisite and Antisite-like Defects; VII. The EL2 Defect; VIII. The DX Centers; Acknowledgment; References; Chapter 2. EL2 Defect in GaAs. 
505 8 |a I. IntroductionII. Properties of EL2 Defect; III. Arsenic Antisite Defect in GaAs; IV. Energy Levels of EL2 Defect; V. Models of EL2 Defect; VI. Conclusions; References; Chapter 3. Defects Relevant for Compensation in Semi-insulating GaAs; I. Introduction; II. Compensation in Bulk GaAs; Ill. The Calculation of Compensation; IV. Known Defects in GaAs; V. The As-Precipitate Model for Compensation; VI. Summary; References; Chapter 4. Local Vibrational Made Spectroscopy of Defects in III/V Compounds; I. Introduction; II. Localized Vibrational Mode Spectroscopy; III. Oxygen Impurities. 
505 8 |a IV. Beryllium ImpuritiesV. Carbon Impurities; VI. Boron Impurities; VII. Silicon Impurities; VIII. Hydrogen Passivation of Shallow Impurities; IX. Radiation Damage; X. Conclusions; Note; Acknowledgments; References; Chapter 5. Transition Metals in III/V Compounds; I. Introduction; II. General Properties of Transition Metal Impurities; III. 3dn Transition Metals; IV. 4dn and 5dn Transition Metals; V. Semi-insulating TM-Doped III/V Materials; Appendices; References; Chapter 6. DX and Related Defects in Semiconductors; I. Introduction; II. Electrical Properties; III. Optical Properties. 
505 8 |a IV. Models of DXV. Microscopic Structure of the DX Center; VI. Magnetic Properties of DX: The Negative-U Issue; VII. Technology and DX; VIII. Summary; Acknowledgments; References; Chapter 7. Dislocations in III/V Compounds; I. Introduction; II. Dislocation Types and Structures; III. Mechanical Properties; IV. Dislocation Generation and Reduction during Growth of Bulk Crystals; V. Dislocations and Device Performance; Note; References; Chapter 8. Deep Level Defects in the Epitaxial III/V Materials; I. Introduction; II. Observation of Deep States in Epitaxial Layers; III. Epitaxial Binaries. 
505 8 |a IV. Epitaxial Ternaries and QuaternariesV. Quantum Wells, Superlattices, and Interfaces; VI. Deep Levels in Structurally Disordered III/V Layers; VII. Conclusion; References; Chapter 9. Structural Defects in Epitaxial III/V Layers; I. Introduction; II. Homoepitaxy; III. Heteroepitaxy; IV. Methods to Decrease the Defest Density in the Epitaxial Layers; V. Conclusions; Acknowledgment; References; Chapter 10. Defects io Metal/III/V Heterostructures; I. Introduction; II. Movement of the Fermi Level and Departures from GaAs Stoichiometry; III. A Model to Explain Fermi Level Moment. 
520 |a SEMICONDUCTORS & amp; SEMIMETALS V38. 
546 |a English. 
650 0 |a Semiconductors  |x Defects. 
650 6 |a Semi-conducteurs  |x D�efauts.  |0 (CaQQLa)201-0318262 
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650 7 |a TECHNOLOGY & ENGINEERING  |x Electronics  |x Semiconductors.  |2 bisacsh 
650 7 |a Semiconductors  |x Defects.  |2 fast  |0 (OCoLC)fst01112211 
650 7 |a Transporte Eletronico E Propriedades Eletricas De Superficies, Interfaces E Peliculas.  |2 larpcal 
650 7 |a Semiconducteurs.  |2 ram 
700 1 |a Weber, Eicke R. 
776 0 8 |i Print version:  |t Imperfections in III/V materials.  |d Boston : Academic Press, �1993  |z 0127521380  |z 9780127521381  |w (OCoLC)28040303 
830 0 |a Semiconductors and semimetals ;  |v v. 38. 
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856 4 0 |u https://sciencedirect.uam.elogim.com/science/bookseries/00808784/38  |z Texto completo