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Measurement of high-speed signals in solid state devices /
SEMICONDUCTORS & amp; SEMIMETALS V28.
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Boston :
Academic Press,
�1990.
|
| Colección: | Semiconductors and semimetals ;
v. 28. |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
MARC
| LEADER | 00000cam a2200000 a 4500 | ||
|---|---|---|---|
| 001 | SCIDIR_ocn288719091 | ||
| 003 | OCoLC | ||
| 005 | 20231117015153.0 | ||
| 006 | m o d | ||
| 007 | cr cnu---unuuu | ||
| 008 | 081217s1990 maua ob 001 0 eng d | ||
| 040 | |a N$T |b eng |e pn |c N$T |d OCLCQ |d OCLCE |d E7B |d OCLCQ |d OPELS |d OCLCQ |d OCLCO |d OCLCF |d YDXCP |d EBLCP |d OCLCQ |d DEBSZ |d OCLCQ |d MERUC |d OCLCQ |d OCLCO |d OCLCQ |d LEAUB |d OCLCQ |d OCLCO |d COM |d OCLCO |d OCLCQ | ||
| 019 | |a 297252349 |a 643832645 |a 646756970 |a 808732769 |a 846083254 | ||
| 020 | |a 9780080864259 |q (electronic bk.) | ||
| 020 | |a 0080864252 |q (electronic bk.) | ||
| 020 | |a 0127521283 |q (electronic bk.) | ||
| 020 | |a 9780127521282 |q (electronic bk.) | ||
| 035 | |a (OCoLC)288719091 |z (OCoLC)297252349 |z (OCoLC)643832645 |z (OCoLC)646756970 |z (OCoLC)808732769 |z (OCoLC)846083254 | ||
| 042 | |a dlr | ||
| 050 | 4 | |a QC610.9 |b .S47 1990eb | |
| 072 | 7 | |a BUS |x 097000 |2 bisacsh | |
| 072 | 7 | |a BUS |x 030000 |2 bisacsh | |
| 082 | 0 | 4 | |a 658.3815 |2 22 |
| 084 | |a 53.15 |2 bcl | ||
| 084 | |a UP 8000 |2 rvk | ||
| 084 | |a UP 2800 |2 rvk | ||
| 245 | 0 | 0 | |a Measurement of high-speed signals in solid state devices / |c volume editor, Robert B. Marcus. |
| 260 | |a Boston : |b Academic Press, |c �1990. | ||
| 300 | |a 1 online resource (xv, 438 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Semiconductors and semimetals ; |v v. 28 | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 506 | |3 Use copy |f Restrictions unspecified |2 star |5 MiAaHDL | ||
| 533 | |a Electronic reproduction. |b [Place of publication not identified] : |c HathiTrust Digital Library, |d 2010. |5 MiAaHDL | ||
| 538 | |a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. |u http://purl.oclc.org/DLF/benchrepro0212 |5 MiAaHDL | ||
| 583 | 1 | |a digitized |c 2010 |h HathiTrust Digital Library |l committed to preserve |2 pda |5 MiAaHDL | |
| 505 | 0 | |a Front Cover; Measurement of High-Speed Signals in Solid State Devices; Copyright Page; Contents; List of Contributors; Preface; Chapter 1. Materials and Devices for High-Speed Devices and Optoelectronic Applications; I. Introduction; II. Important Materials Parameters; III. Device Parameters; IV. Devices for Switching and Amplification; V. Microwave Two-Terminal Devices; VI. Integrated Circuits; VII. Optoelectronic Devices; VIII. Conclusions; References; Chapter 2. Electronic Wafer Probing Techniques; I. Introduction; II. Electronic Characterization Methods; III. Wafer Probing. | |
| 505 | 8 | |a IV. ConclusionsReferences; Chapter 3. Picosecond Photoconductivity: High-Speed Measurements of Devices and Materials; I. Introduction; II. Materials for Picosecond Photoconductors; III. Generation and Detection of Ultrafast Electrical Pulses; IV. Optoelectronic Measurement Systems and Their Applications; V. Discussion and Future Trends; References; Chapter 4. Electro-Optic Measurement Techniques for Picosecond Materials. Devices and Integrated Circuits; I. Introduction; II. Electro-Optic Modulation; III. Principles of Electro-Optic Sampling; IV. Hybrid Sampling of Devices and Materials. | |
| 505 | 8 | |a v. Electro-Optic Probing of Integrated CircuitsVI. Nonsampling Techniques; VII. Conclusions; References; Chapter 5. Direct Optical Probing of Integrated Circuits and High-Speed Devices; I. Introduction; II. General Considerations; III. Direct Probing by Photocarrier Generation; IV. Direct Probing by Electro-Optic Sampling; V. Direct Probing by Charge-Density Modulation; VI. Phase-Space Absorption Quenching; VII. Summary and Outlook; References; Chapter 6. Electron-Beam Probing; I. Introduction: Pros and Cons of the Focused Electron Beam for Probing High-Speed Electrical Signals. | |
| 505 | 8 | |a II. Background Science, Technology, and HistoryIII. Sampling by E-Beam Pulsing; IV. Electron Energy Filtering in E-Beam Testing; V. The Existing Limits of Performance; VI. Useful and Less Useful "Modes" (Including Brief Application Descriptions); VII. Software Control; References; Chapter 7. Photoemissive Probing; I. Introduction; II. Photoemission; III. Signal Detection and Waveform Measurement; IV. Performance of Photoemissive Sampling; V. Discussion; VI. Summary and Future Trends; References; Glossary of Symbols; Index; Contents of Previous Volumes. | |
| 520 | |a SEMICONDUCTORS & amp; SEMIMETALS V28. | ||
| 650 | 0 | |a Solid state electronics. | |
| 650 | 6 | |a �Electronique de l'�etat solide. |0 (CaQQLa)201-0024817 | |
| 650 | 7 | |a BUSINESS & ECONOMICS |x Workplace Culture. |2 bisacsh | |
| 650 | 7 | |a BUSINESS & ECONOMICS |x Human Resources & Personnel Management. |2 bisacsh | |
| 650 | 7 | |a Solid state electronics. |2 fast |0 (OCoLC)fst01125449 | |
| 650 | 7 | |a Halbleiterbauelement |2 gnd |0 (DE-588)4113826-0 | |
| 655 | 7 | |a Hochgeschwindigkeitssignal. |2 swd | |
| 700 | 1 | |a Marcus, R. B. |q (Robert B.) | |
| 776 | 0 | 8 | |i Print version: |t Measurement of high-speed signals in solid state devices. |d Boston : Academic Press, �1990 |z 0127521283 |z 9780127521282 |w (OCoLC)21271618 |
| 830 | 0 | |a Semiconductors and semimetals ; |v v. 28. | |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780127521282 |z Texto completo |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/bookseries/00808784/28 |z Texto completo |