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Injection phenomena /

SEMICONDUCTORS & amp; SEMIMETALS V6.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Willardson, Robert K., Beer, Albert C.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York ; London : Academic Press, 1970.
Colección:Semiconductors and semimetals ; v. 6.
Temas:
Acceso en línea:Texto completo
Texto completo
Tabla de Contenidos:
  • Front Cover; Semiconductors and Semimetals, Volume 6; Copyright Page; Contents; List of Contributors; Prefece; Contents of Previous Volumes; Chapter 1. Current Injection in Solids: The Regional Approximation Method; I. Introduction; ll. One-Carrier Problems; lll. Two-Carrier Problems; IV. A Transistor Design Problem; Chapter 2. Injection by Internal Photoemission; I. General Ideas on Internal Photoemission; ll. Physics of Internal Photoemission; lll. Experimental Results for Barrier Heights; IV. Electron and Hole Energy Losses in Metals; V. Transport and Trapping in Insulators.
  • Chapter 3. Current Filament FormationI . Introduction; ll. Theory of Current Filament Formation; lll. Experimental Observation of Current Filaments; IV. Some Boundary Conditions; V. Concluding Remarks; Chapter 4. Double Injection in Semiconductors; l. Introduction; ll. Small Density of Deep Centers-Theoryry; lll. Small Density of Deep Centers-Experimentnt; IV. Large Numbers of Deep Centers-Theoryry; V. Large Numbers of Deep Centers-Experimentnt; VI. Transient and Small-Signal AC Response; VII. Appendix-Interpretation of Potential-Probe Measurements; List of Symbols.
  • Chapter 5. The Photoconductor-Metal ContactI. Introduction; ll. The Photoconductor-Metal Contact under Externally Applied Voltage; lll. The Photoconductor-Metal Contact without Externally Applied Voltage; Author Index; Subject Index.