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Injection phenomena /

SEMICONDUCTORS & amp; SEMIMETALS V6.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Willardson, Robert K., Beer, Albert C.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York ; London : Academic Press, 1970.
Colección:Semiconductors and semimetals ; v. 6.
Temas:
Acceso en línea:Texto completo
Texto completo

MARC

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245 0 0 |a Injection phenomena /  |c edited by R.K. Willardson, Albert C. Beer. 
260 |a New York ;  |a London :  |b Academic Press,  |c 1970. 
300 |a 1 online resource (xiii, 361 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Semiconductors and semimetals ;  |v v. 6 
504 |a Includes bibliographical references and indexes. 
588 0 |a Print version record. 
506 |3 Use copy  |f Restrictions unspecified  |2 star  |5 MiAaHDL 
533 |a Electronic reproduction.  |b [Place of publication not identified] :  |c HathiTrust Digital Library,  |d 2010.  |5 MiAaHDL 
538 |a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.  |u http://purl.oclc.org/DLF/benchrepro0212  |5 MiAaHDL 
583 1 |a digitized  |c 2010  |h HathiTrust Digital Library  |l committed to preserve  |2 pda  |5 MiAaHDL 
505 0 |a Front Cover; Semiconductors and Semimetals, Volume 6; Copyright Page; Contents; List of Contributors; Prefece; Contents of Previous Volumes; Chapter 1. Current Injection in Solids: The Regional Approximation Method; I. Introduction; ll. One-Carrier Problems; lll. Two-Carrier Problems; IV. A Transistor Design Problem; Chapter 2. Injection by Internal Photoemission; I. General Ideas on Internal Photoemission; ll. Physics of Internal Photoemission; lll. Experimental Results for Barrier Heights; IV. Electron and Hole Energy Losses in Metals; V. Transport and Trapping in Insulators. 
505 8 |a Chapter 3. Current Filament FormationI . Introduction; ll. Theory of Current Filament Formation; lll. Experimental Observation of Current Filaments; IV. Some Boundary Conditions; V. Concluding Remarks; Chapter 4. Double Injection in Semiconductors; l. Introduction; ll. Small Density of Deep Centers-Theoryry; lll. Small Density of Deep Centers-Experimentnt; IV. Large Numbers of Deep Centers-Theoryry; V. Large Numbers of Deep Centers-Experimentnt; VI. Transient and Small-Signal AC Response; VII. Appendix-Interpretation of Potential-Probe Measurements; List of Symbols. 
505 8 |a Chapter 5. The Photoconductor-Metal ContactI. Introduction; ll. The Photoconductor-Metal Contact under Externally Applied Voltage; lll. The Photoconductor-Metal Contact without Externally Applied Voltage; Author Index; Subject Index. 
520 |a SEMICONDUCTORS & amp; SEMIMETALS V6. 
546 |a English. 
650 0 |a Semiconductors. 
650 0 |a Semimetals. 
650 2 |a Semiconductors  |0 (DNLM)D012666 
650 6 |a Semi-conducteurs.  |0 (CaQQLa)201-0318258 
650 6 |a Semi-m�etaux.  |0 (CaQQLa)201-0096003 
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650 7 |a SCIENCE  |x Physics  |x Electricity.  |2 bisacsh 
650 7 |a Semiconductors.  |2 fast  |0 (OCoLC)fst01112198 
650 7 |a Semimetals.  |2 fast  |0 (OCoLC)fst01112274 
700 1 |a Willardson, Robert K. 
700 1 |a Beer, Albert C. 
776 0 8 |i Print version:  |t Injection phenomena.  |d New York ; London : Academic Press, 1970  |z 0127521062  |z 9780127521060  |w (OCoLC)229906288 
830 0 |a Semiconductors and semimetals ;  |v v. 6. 
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