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00000cam a2200000Ia 4500 |
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SCIDIR_ocn265430786 |
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OCoLC |
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20231117015125.0 |
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m o d |
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cr cnu---unuuu |
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081030s1989 maua ob 001 0 eng d |
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|z 49007504
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040 |
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|a N$T
|b eng
|e pn
|c N$T
|d OCLCQ
|d UBY
|d IDEBK
|d E7B
|d OCLCQ
|d OPELS
|d AU@
|d OCLCQ
|d OCLCF
|d YDXCP
|d OCLCQ
|d DEBSZ
|d LEAUB
|d VLY
|d OCLCO
|d OCLCQ
|d OCLCO
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019 |
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|a 505089897
|a 646754552
|a 759565445
|a 907041314
|a 1162080588
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020 |
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|a 9780080577395
|q (electronic bk.)
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020 |
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|a 0080577393
|q (electronic bk.)
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020 |
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|a 0120146738
|q (electronic bk.)
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020 |
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|a 9780120146734
|q (electronic bk.)
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020 |
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|a 1281411493
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020 |
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|a 9781281411495
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020 |
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|a 9786611411497
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|a 6611411496
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035 |
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|a (OCoLC)265430786
|z (OCoLC)505089897
|z (OCoLC)646754552
|z (OCoLC)759565445
|z (OCoLC)907041314
|z (OCoLC)1162080588
|
050 |
|
4 |
|a QC793.5.E62
|b A38eb vol. 73
|
072 |
|
7 |
|a TEC
|x 030000
|2 bisacsh
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082 |
0 |
4 |
|a 621.36
|2 22
|
245 |
0 |
0 |
|a Advances in electronics and electron physics.
|n Volume 73,
|p Aspects of charged particle optics /
|c edited by Peter W. Hawkes.
|
260 |
|
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|a Boston :
|b Academic Press,
|c �1989.
|
300 |
|
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|a 1 online resource (xii, 324 pages) :
|b illustrations.
|
336 |
|
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|a text
|b txt
|2 rdacontent
|
337 |
|
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|a computer
|b c
|2 rdamedia
|
338 |
|
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|a online resource
|b cr
|2 rdacarrier
|
490 |
1 |
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|a Advances in electronics and electron physics,
|x 0065-2539 ;
|v 73
|
504 |
|
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|a Includes bibliographical references and index.
|
588 |
0 |
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|a Print version record.
|
505 |
0 |
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|a Ion optics -- Proton microscopes and their applications -- An early history of the electron microscopes in the United States -- Electron beam testing.
|
520 |
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|a ADV ELECTRONICS ELECTRON PHYSICS V73.
|
546 |
|
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|a English.
|
650 |
|
0 |
|a Electron optics.
|
650 |
|
0 |
|a Proton beams.
|
650 |
|
0 |
|a Electron microscopes.
|
650 |
|
6 |
|a Optique �electronique.
|0 (CaQQLa)201-0006721
|
650 |
|
6 |
|a Faisceaux de protons.
|0 (CaQQLa)000259574
|
650 |
|
6 |
|a Microscopes �electroniques.
|0 (CaQQLa)201-0014917
|
650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Optics.
|2 bisacsh
|
650 |
|
7 |
|a Electron microscopes
|2 fast
|0 (OCoLC)fst00906679
|
650 |
|
7 |
|a Electron optics
|2 fast
|0 (OCoLC)fst00906693
|
650 |
|
7 |
|a Proton beams
|2 fast
|0 (OCoLC)fst01080066
|
700 |
1 |
|
|a Hawkes, P. W.
|
776 |
0 |
8 |
|i Print version:
|t Advances in electronics and electron physics. Volume 73, Aspects of charged particle optics.
|d Boston : Academic Press, �1989
|z 9780120146734
|
830 |
|
0 |
|a Advances in electronics and electron physics ;
|v 73.
|
856 |
4 |
0 |
|u https://sciencedirect.uam.elogim.com/science/book/9780120146734
|z Texto completo
|