Advances in electronics and electron physics. Volume 79 /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boston : Academic Press, �1990.
Colección:Advances in electronics and electron physics ; v. 79.
Temas:
Scanning electron microscopes.
Electrons.
Silicon.
Ion bombardment.
Microscopy.
Cathode ray tubes.
Electrons
Silicon
Microscopy
Microscopes �electroniques �a balayage.
�Electrons.
Silicium.
Bombardement ionique.
Microscopie.
Tubes �a rayons cathodiques.
silicon.
microscopy.
TECHNOLOGY & ENGINEERING > Electrical.
Cathode ray tubes
Ion bombardment
Scanning electron microscopes
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Algebraic systems, trellis codes, and rotational invariance / Howard J. Chizeck and Mitchell D. Trott
  • Topography of surfaces modified by fast ion bombardment / D. Ghose and S.B. Karmohapatro
  • Scanning tunneling microscopy / L.L. Soethout, H. van Kemper, G.F.A. van de Walle
  • Phosphor materials for cathode-ray tubes / Takashi Hase [and others].

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