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Advances in electronics and electron physics. Volume 79 /

Detalles Bibliográficos
Clasificación:	Libro Electrónico
Otros Autores:	Hawkes, P. W.
Formato:	Electrónico eBook
Idioma:	Inglés
Publicado:	Boston : Academic Press, �1990.
Colección:	Advances in electronics and electron physics ; v. 79.
Temas:	Scanning electron microscopes. Electrons. Silicon. Ion bombardment. Microscopy. Cathode ray tubes. Electrons Silicon Microscopy Microscopes �electroniques �a balayage. �Electrons. Silicium. Bombardement ionique. Microscopie. Tubes �a rayons cathodiques. silicon. microscopy. TECHNOLOGY & ENGINEERING > Electrical. Cathode ray tubes Ion bombardment Scanning electron microscopes
Acceso en línea:	Texto completo

Tabla de Contenidos:

Algebraic systems, trellis codes, and rotational invariance / Howard J. Chizeck and Mitchell D. Trott
Topography of surfaces modified by fast ion bombardment / D. Ghose and S.B. Karmohapatro
Scanning tunneling microscopy / L.L. Soethout, H. van Kemper, G.F.A. van de Walle
Phosphor materials for cathode-ray tubes / Takashi Hase [and others].