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Advances in imaging and electron physics. Volume 125 /
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles onthe physics of electron devices (especially semiconductor devices), particle optics at high and lo...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam ; Boston :
Academic Press,
�2002.
|
| Colección: | Advances in imaging and electron physics ;
125 |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo Texto completo |
Tabla de Contenidos:
- Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Contributors; Preface; Future Contributions; Chapter 1. An Algebraic Approach to Subband Signal Processing; I. Introduction; II. An Overview of Recursive Matrices; III. Recursive Operators of Filter Theory; IV. More Algebraic Results; V. Analysis and Synthesis Filter Banks; VI. M-Channel Filter Bank Systems; VII. Transmultiplexers; VIII. The M-Band Lifting; IX. Conclusion; References; Chapter 2. Determining the Locations of Chemical Species in Ordered Compounds: ALCHEMI; I. Background; II. Fundamentals
- III. ALCHEMI ResultsIV. Predicting Sublattice Occupancies; V. Competing (or Supplementary) Techniques; VI. Summary; VII. Current Challenges and Future Directions (a Personal View); References; Chapter 3. Aspects of Mathematical Morphology; I. Introduction; II. Integral Geometry: Theory; III. Integral Geometry in Practice; IV. Illustrative Examples; V. Computer Tomography Images of Metal Foams; VI. Summary; Appendix A: Algorithm; Appendix B: Programming Example (Fortran 90); Appendix C: Derivation of Eq. (36); Appendix D: Proof of Eq. (56); Appendix E: Proof of Eq. (57); References
- Appendix B. Gallager Codes: Technical DetailsAppendix C. MN Codes: Technical Details; References; Chapter 6.Computer-Aided Crystallographic Analysis in the TEM; I. Introduction; II. Electron Diffraction and Diffraction Contrast; III. A Universal Procedure for Orientation Determination from Electron Diffraction Patterns; IV. Automation of Orientation Determination in TEM; V. Characterization of Grain Boundaries; VI. Determination of Slip Systems; VII. Phase and Lattice Parameter Determination; VIII. Calibration; IX. Conclusions; References; Index