Cargando…
Advances in imaging and electron physics. Volume 125 /
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles onthe physics of electron devices (especially semiconductor devices), particle optics at high and lo...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam ; Boston :
Academic Press,
�2002.
|
| Colección: | Advances in imaging and electron physics ;
125 |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo Texto completo |
MARC
| LEADER | 00000cam a2200000 a 4500 | ||
|---|---|---|---|
| 001 | SCIDIR_ocn180111748 | ||
| 003 | OCoLC | ||
| 005 | 20231117015055.0 | ||
| 006 | m o d | ||
| 007 | cr cnu---unuuu | ||
| 008 | 071031s2002 ne a ob 001 0 eng d | ||
| 040 | |a N$T |b eng |e pn |c N$T |d OCLCQ |d YDXCP |d OCLCQ |d UBY |d E7B |d OCLCQ |d OPELS |d OCLCQ |d OPELS |d OCLCF |d OCLCQ |d DEBBG |d D6H |d LEAUB |d VLY |d OCLCO |d OCLCQ |d OCLCO | ||
| 019 | |a 173980009 |a 505136991 |a 648245552 |a 905910963 |a 1162520561 | ||
| 020 | |a 9780080522241 |q (electronic bk.) | ||
| 020 | |a 0080522246 |q (electronic bk.) | ||
| 020 | |a 012014767X |q (electronic bk.) | ||
| 020 | |a 9780120147670 |q (electronic bk.) | ||
| 020 | |a 1281020648 | ||
| 020 | |a 9781281020642 | ||
| 020 | |a 9786611020644 | ||
| 020 | |a 6611020640 | ||
| 035 | |a (OCoLC)180111748 |z (OCoLC)173980009 |z (OCoLC)505136991 |z (OCoLC)648245552 |z (OCoLC)905910963 |z (OCoLC)1162520561 | ||
| 050 | 4 | |a QC793.5.E62 |b A38eb vol. 125 | |
| 072 | 7 | |a SCI |x 022000 |2 bisacsh | |
| 072 | 7 | |a SCI |x 021000 |2 bisacsh | |
| 082 | 0 | 4 | |a 537.5/6 |2 22 |
| 245 | 0 | 0 | |a Advances in imaging and electron physics. |n Volume 125 / |c edited by Peter W. Hawkes. |
| 260 | |a Amsterdam ; |a Boston : |b Academic Press, |c �2002. | ||
| 300 | |a 1 online resource (xvi, 426 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 0 | |a Advances in imaging and electron physics ; |v 125 | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 520 | |a Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles onthe physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. | ||
| 505 | 0 | |a Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Contributors; Preface; Future Contributions; Chapter 1. An Algebraic Approach to Subband Signal Processing; I. Introduction; II. An Overview of Recursive Matrices; III. Recursive Operators of Filter Theory; IV. More Algebraic Results; V. Analysis and Synthesis Filter Banks; VI. M-Channel Filter Bank Systems; VII. Transmultiplexers; VIII. The M-Band Lifting; IX. Conclusion; References; Chapter 2. Determining the Locations of Chemical Species in Ordered Compounds: ALCHEMI; I. Background; II. Fundamentals | |
| 505 | 8 | |a III. ALCHEMI ResultsIV. Predicting Sublattice Occupancies; V. Competing (or Supplementary) Techniques; VI. Summary; VII. Current Challenges and Future Directions (a Personal View); References; Chapter 3. Aspects of Mathematical Morphology; I. Introduction; II. Integral Geometry: Theory; III. Integral Geometry in Practice; IV. Illustrative Examples; V. Computer Tomography Images of Metal Foams; VI. Summary; Appendix A: Algorithm; Appendix B: Programming Example (Fortran 90); Appendix C: Derivation of Eq. (36); Appendix D: Proof of Eq. (56); Appendix E: Proof of Eq. (57); References | |
| 505 | 8 | |a Appendix B. Gallager Codes: Technical DetailsAppendix C. MN Codes: Technical Details; References; Chapter 6.Computer-Aided Crystallographic Analysis in the TEM; I. Introduction; II. Electron Diffraction and Diffraction Contrast; III. A Universal Procedure for Orientation Determination from Electron Diffraction Patterns; IV. Automation of Orientation Determination in TEM; V. Characterization of Grain Boundaries; VI. Determination of Slip Systems; VII. Phase and Lattice Parameter Determination; VIII. Calibration; IX. Conclusions; References; Index | |
| 546 | |a English. | ||
| 650 | 0 | |a Electrons. | |
| 650 | 0 | |a Image processing. | |
| 650 | 0 | |a Electronics. | |
| 650 | 2 | |a Electrons |0 (DNLM)D004583 | |
| 650 | 2 | |a Electronics |0 (DNLM)D004581 | |
| 650 | 6 | |a �Electrons. |0 (CaQQLa)201-0004714 | |
| 650 | 6 | |a Traitement d'images. |0 (CaQQLa)201-0029952 | |
| 650 | 6 | |a �Electronique. |0 (CaQQLa)201-0001759 | |
| 650 | 7 | |a image processing. |2 aat |0 (CStmoGRI)aat300237864 | |
| 650 | 7 | |a SCIENCE |x Physics |x Electromagnetism. |2 bisacsh | |
| 650 | 7 | |a SCIENCE |x Physics |x Electricity. |2 bisacsh | |
| 650 | 7 | |a Electronics |2 fast |0 (OCoLC)fst00907538 | |
| 650 | 7 | |a Electrons |2 fast |0 (OCoLC)fst00907642 | |
| 650 | 7 | |a Image processing |2 fast |0 (OCoLC)fst00967501 | |
| 700 | 1 | |a Hawkes, P. W. | |
| 776 | 0 | 8 | |i Print version: |t Advances in imaging and electron physics. Volume 125. |d Amsterdam ; Boston : Academic Press, �2002 |z 9780120147670 |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780120147670 |z Texto completo |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/bookseries/10765670/125 |z Texto completo |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/publication?issn=10765670&volume=125 |z Texto completo |