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Microscopy, spectroscopy, holography and crystallography with electrons /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterstam ; Boston : Academic Press, �2002.
Colección:Advances in imaging and electron physics ; v. 123.
Temas:
Acceso en línea:Texto completo
Texto completo
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MARC

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245 0 0 |a Microscopy, spectroscopy, holography and crystallography with electrons /  |c edited by Peter W. Hawkes. 
260 |a Amsterstam ;  |a Boston :  |b Academic Press,  |c �2002. 
300 |a 1 online resource (xvi, 462 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
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490 1 |a Advances in imaging and electron physics ;  |v v. 123 
504 |a Includes bibliographical references and index. 
505 0 0 |t Signposts in electron optics /  |r P.W. Hawkes. --  |t Introduction to crystallography /  |r Gianluca Calestani. --  |t Convergent beam electron diffraction /  |r J.W. Steeds. --  |t High-resolution electron microscopy /  |r Dirk Van Dyck. --  |t Structure determination through Z-contrast microscopy /  |r S.J. Pennycook. --  |t Electron holography of long-range electromagnetic fields: a tutorial /  |r G. Pozzi. --  |t Electron holography: a powerful tool for the analysis of nanostructures /  |r Hannes Lichte and Michael Lehmann. --  |t Crystal structure determination from EM images and electron diffraction patterns /  |r Sven Hovm�oller, Xiadong Zou, and Thomas E. Weirich. --  |t Direct methods and applications to electron crystallography /  |r C. Giacovazzo, F. Capitelli, C. Cuocci, and M. Ianigro. --  |t Strategies to electron diffraction data collection /  |r M. Gemmi, G. Calestani, and A. Migliori. --  |t Advances in scanning electron microscopy /  |r Lud�ek Frank. --  |t On the spatial resolution and nanoscale feature visibility in scanning electron microscopy /  |r P.G. Merli and V. Morandi. --  |t Nanoscale analysis by energy-filtering TEM /  |r Joachim Mayer. --  |t Ionization edges: some underlying physics and their use in electron microscopy /  |r Bernard Jouffrey, Peter Schattschneider, and C�ecile H�ebert. 
520 |a Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. 
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650 0 |a Spectrum analysis. 
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