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Advances in imaging and electron physics. Volume 118 /

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Diego, Calif. : Academic Press, �2001.
Colección:Advances in imaging and electron physics ; v. 118
Temas:
Acceso en línea:Texto completo
Texto completo
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MARC

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245 0 0 |a Advances in imaging and electron physics.  |n Volume 118 /  |c edited by Peter W. Hawkes. 
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490 0 |a Advances in imaging and electron physics ;  |v v. 118 
500 |a Title from PDF title page (viewed October 26, 2007). 
500 |a Title from PDF title page (viewed September 27, 2007). 
504 |a Includes bibliographical references and index. 
520 |a Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. 
505 0 |a Front Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Contributors; Preface; Future Contributions; Chapter 1. Magnetic Resonance Imaging and Magnetization Transfer; Chapter 2. Noninterferometric Phase Determination; Chapter 3. Recent Developments of Probes for Scanning Probe Microscopy; Chapter 4. Morphological Image Enhancement and Segmentation; Index. 
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