Cargando…
Advances in imaging and electron physics. Volume 113 /
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics a...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Diego ; San Francisco :
Academic Press,
�2000.
|
| Colección: | Advances in imaging and electron physics ;
113. |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo Texto completo |
Tabla de Contenidos:
- Front Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Contributors; Preface; Forthcoming Contributions; Chapter 1. The Finite Volume, Finite Element, and Finite Difference Methods as Numerical Methods for Physical Field Problems; I. Introduction; II. Foundations; III. Representations; IV. Methods; V. Conclusions; References; Chapter 2. The Principles and Interpretations of Annular Dark-Field Z-Contrast Imaging; I. Introduction; II. Transverse Incoherence; III. Longitudinal Coherence; IV. The Ultimate Resolution and the Information Limit
- v. Quantitative Image Processing and AnalysisVI. Conclusions; Acknowledgments; References; Chapter 3. Measurement of Magnetic Fields and Domain Structures Using a Photoemission Electron Microscope; I. Introduction; II. Imaging of Ferromagnetic Domain Boundaries in a PEEM in the Operation Mode Without Restriction of the Electron Beam.; III. Imaging of Ferromagnetic Domain Boundaries in PEEM in the Case of Restriction of the Electron Beam by Contrast Aperture or Knife-Edge; IV. Magnetic Domain Imaging in X-PEEM Using Magnetic X-Ray Circular Dichroism
- v. Magnetic Domain Imaging in UV-PEEM Using a Kerr-Effect-Like ContrastVI. Conclusions; Acknowledgments; References; Chapter 4. Improved Laser Scanning Fluorescence Microscopy by Multiphoton Excitation; I. Introduction; II. Future Prospects; References; Index