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Advances in imaging and electron physics. Volume 113 /
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics a...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Diego ; San Francisco :
Academic Press,
�2000.
|
| Colección: | Advances in imaging and electron physics ;
113. |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo Texto completo |
MARC
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| 245 | 0 | 0 | |a Advances in imaging and electron physics. |n Volume 113 / |c edited by Peter W. Hawkes. |
| 260 | |a San Diego ; |a San Francisco : |b Academic Press, |c �2000. | ||
| 300 | |a 1 online resource (1 volume) : |b illustrations | ||
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| 490 | 1 | |a Advances in imaging and electron physics, |x 1076-5670 ; |v 113 | |
| 504 | |a Includes bibliographical references and index. | ||
| 520 | |a Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a Front Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Contributors; Preface; Forthcoming Contributions; Chapter 1. The Finite Volume, Finite Element, and Finite Difference Methods as Numerical Methods for Physical Field Problems; I. Introduction; II. Foundations; III. Representations; IV. Methods; V. Conclusions; References; Chapter 2. The Principles and Interpretations of Annular Dark-Field Z-Contrast Imaging; I. Introduction; II. Transverse Incoherence; III. Longitudinal Coherence; IV. The Ultimate Resolution and the Information Limit | |
| 505 | 8 | |a v. Quantitative Image Processing and AnalysisVI. Conclusions; Acknowledgments; References; Chapter 3. Measurement of Magnetic Fields and Domain Structures Using a Photoemission Electron Microscope; I. Introduction; II. Imaging of Ferromagnetic Domain Boundaries in a PEEM in the Operation Mode Without Restriction of the Electron Beam.; III. Imaging of Ferromagnetic Domain Boundaries in PEEM in the Case of Restriction of the Electron Beam by Contrast Aperture or Knife-Edge; IV. Magnetic Domain Imaging in X-PEEM Using Magnetic X-Ray Circular Dichroism | |
| 505 | 8 | |a v. Magnetic Domain Imaging in UV-PEEM Using a Kerr-Effect-Like ContrastVI. Conclusions; Acknowledgments; References; Chapter 4. Improved Laser Scanning Fluorescence Microscopy by Multiphoton Excitation; I. Introduction; II. Future Prospects; References; Index | |
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| 700 | 1 | |a Hawkes, P. W. | |
| 776 | 0 | 8 | |i Print version: |t Advances in imaging and electron physics. Volume 113. |d San Diego ; San Francisco : Academic Press, �2000 |z 0120147556 |z 9780120147557 |w (OCoLC)44404773 |
| 830 | 0 | |a Advances in imaging and electron physics ; |v 113. |x 1076-5670 | |
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| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/publication?issn=10765670&volume=113 |z Texto completo |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780120147557 |z Texto completo |