Principles of semiconductor network testing /

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This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Afshar, Amir
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boston : Butterworth-Heinemann, �1995.
�1995
Temas:
Integrated circuits > Testing.
Semiconductors > Testing.
Semi-conducteurs > Essais.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
Integrated circuits > Testing
Semiconductors > Testing
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Front Cover; Principles of Semiconductor Network Testing; Copyright Page; Contents; Foreword; Preface; Chapter 1. Diode and Transistor Operation; Chapter 2. Integrated Circuit Test Basics; Chapter 3. Digital Logic Test; Chapter 4. Noise Identification; Chapter 5. Operational Amplifier; Chapter 6. Data Acquisition Devices; Chapter 7. Digital Signal Processing; Chapter 8. CODEC (Coder/Decoder); Index.

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