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Principles of semiconductor network testing /

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Afshar, Amir
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boston : Butterworth-Heinemann, �1995.
�1995
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.
Descripción Física:1 online resource (xiv, 213 pages) : illustrations
Bibliografía:Includes bibliographical references and index.
ISBN:9780080539560
0080539564