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Advances in imaging and electron physics. Volume 138 /
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...
| Clasificación: | Libro Electrónico |
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| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam :
Elsevier/Academic Press,
�2005.
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| Colección: | Advances in imaging and electron physics ;
138. |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo Texto completo |
| Sumario: | Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Discusses Spectral Color Spaces - Covers Phase Contrast Enhancement with Phase Plates in Electron Microscopy - Studies the Optical Properties of Gas Phase Field Ionization Sources - Looks at Symmetric and Nonsymmetric Divergence Measures and Their Generalizations - Describes the features and future of the International System of Units (SI) - Illustrates Importance Sampling Hough Transform. |
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| Descripción Física: | 1 online resource (xvii, 371 pages) : illustrations |
| Bibliografía: | R�ef�erences bibliogr. et index. |
| ISBN: | 0120147807 9780120147809 |
| ISSN: | 1076-5670 ; |