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Advances in imaging and electron physics. Volume 130 /
The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which op...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam ; Boston :
Elsevier/Academic Press,
�2004.
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| Colección: | Advances in imaging and electron physics ;
130 |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo Texto completo |
Tabla de Contenidos:
- Front Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Contributors; Preface; Future Contributions; Chapter 1. Statistical Experimental Design for Quantitative Atomic Resolution Transmission Electron Microscopy; I. Introduction; II. Basic Principles of Statistical Experimental Design; III. Statistical Experimental Design of Atomic Resolution Transmission Electron Microscopy Using Simplified Models; IV. Optimal Statistical Experimental Design of Conventional Transmission Electron Microscopy
- v. Optimal Statistical Experimental Design of Scanning Transmission Electron MicroscopyVI. Discussion and Conclusions; References; Chapter 2. Transform-Based Image Enhancement Algorithms with Performance Measure; I. Introduction; II. Transforms with Frequency Ordered Systems; III. Tensor Method of Image Enhancement; References; Chapter 3. Image Registration: An Overview; I. Introduction; II. Similarity Measures; III. Deriving the Transformation Between the Two Images; IV. Feature Extraction; V. Literature Survey; VI. Conclusions; References; Index