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Advances in imaging and electron physics. Volume 130 /
The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which op...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam ; Boston :
Elsevier/Academic Press,
�2004.
|
| Colección: | Advances in imaging and electron physics ;
130 |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo Texto completo |
MARC
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| 245 | 0 | 0 | |a Advances in imaging and electron physics. |n Volume 130 / |c edited by Peter W. Hawkes. |
| 260 | |a Amsterdam ; |a Boston : |b Elsevier/Academic Press, |c �2004. | ||
| 300 | |a 1 online resource (xv, 315 pages) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 0 | |a Advances in imaging and electron physics ; |v 130 | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 520 | |a The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored fully. This is followed by a contribution by A.M. Grigoryan and S.S. Again on transform-based image enhancement, covering both frequency-ordered systems and tensor approaches. The volume concludes with an account of the problems of image registration and ways of solving them by Maria Petrou of the University of Surrey; feature detection, related image transforms and quality measures are examined separately. The text bridges the gap between academic researchers and R & D designers by addressing and solving daily issues, which makes this book essential reading. Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics Presents theory and it's application in a practical sense, providing long awaited solutions and new findings Provides a comprehensive overview of international congress proceedings and associated publications, as source material. | ||
| 505 | 0 | |a Front Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Contributors; Preface; Future Contributions; Chapter 1. Statistical Experimental Design for Quantitative Atomic Resolution Transmission Electron Microscopy; I. Introduction; II. Basic Principles of Statistical Experimental Design; III. Statistical Experimental Design of Atomic Resolution Transmission Electron Microscopy Using Simplified Models; IV. Optimal Statistical Experimental Design of Conventional Transmission Electron Microscopy | |
| 505 | 8 | |a v. Optimal Statistical Experimental Design of Scanning Transmission Electron MicroscopyVI. Discussion and Conclusions; References; Chapter 2. Transform-Based Image Enhancement Algorithms with Performance Measure; I. Introduction; II. Transforms with Frequency Ordered Systems; III. Tensor Method of Image Enhancement; References; Chapter 3. Image Registration: An Overview; I. Introduction; II. Similarity Measures; III. Deriving the Transformation Between the Two Images; IV. Feature Extraction; V. Literature Survey; VI. Conclusions; References; Index | |
| 546 | |a English. | ||
| 650 | 0 | |a Electrons. | |
| 650 | 0 | |a Electron microscopes. | |
| 650 | 0 | |a Microscopy. | |
| 650 | 0 | |a Image processing. | |
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| 650 | 6 | |a Microscopes �electroniques. |0 (CaQQLa)201-0014917 | |
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| 650 | 6 | |a Traitement d'images. |0 (CaQQLa)201-0029952 | |
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| 650 | 7 | |a image processing. |2 aat |0 (CStmoGRI)aat300237864 | |
| 650 | 7 | |a SCIENCE |x Physics |x Electromagnetism. |2 bisacsh | |
| 650 | 7 | |a SCIENCE |x Physics |x Electricity. |2 bisacsh | |
| 650 | 7 | |a Electron microscopes |2 fast |0 (OCoLC)fst00906679 | |
| 650 | 7 | |a Electrons |2 fast |0 (OCoLC)fst00907642 | |
| 650 | 7 | |a Image processing |2 fast |0 (OCoLC)fst00967501 | |
| 650 | 7 | |a Microscopy |2 fast |0 (OCoLC)fst01020062 | |
| 700 | 1 | |a Hawkes, P. W. | |
| 776 | 0 | 8 | |i Print version: |t Advances in imaging and electron physics. Volume 130. |d Amsterdam ; Boston : Elsevier/Academic Press, �2004 |z 9780120147724 |z 0120147726 |w (OCoLC)149112218 |
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| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/publication?issn=10765670&volume=130 |z Texto completo |