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Principles of electron optics. vol. 1-3.
This set is a reprint of the acclaimed three-volume series, Principles of Electron Optics which represents the first and only comprehensive treatment of electron optics in over forty years. Each volume focuses on different aspects of Electron Optics, but together these three volumes cover systematic...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
[Place of publication not identified] :
Academic Press,
1994.
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| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Introduction. Part I--Classical Mechanics: Relativistic Kinematics. Different Forms of Trajectory Equations. Variational Principles. Hamiltonian Optics. Part II--Calculation of Static Fields: Basic Concepts and Equations. Series Expansions. Boundary-Value Problems. Integral Equations. The Boundary-Element Method. The Finite-Difference Method (FDM). The Finite-Element Method (FEM). Field-Interpolation Techniques. Part III--The Paraxial Approximation: Introduction. Systems with an Axis of Rotational Symmetry. Gaussian Optics of Rotationally Symmetric Systems: Asymptotic Image Formation. Gaussian Optics of Rotationally Symmetric Systems: Real Cardinal Elements. Electron Mirrors. Quadrupole Lenses. Cylindrical Lenses. Part IV--Aberrations: Introduction. Perturbation Theory: General Formalism. The Relation Between Permitted Types of Aberration and System Symmetry. The Geometrical Aberrations of Round Lenses. Asymptotic Aberration Coefficients. Chromatic Aberrations. Aberration Matrices and the Aberrations of Lens Combinations. The Aberrations of Mirrors and Cathode Lenses. The Aberrations of Quadrupole Lenses and Octopoles. The Aberrations of Cylindrical Lenses. Parasitic Aberrations. Part V--Deflection Systems: Deflection Systems and their Aberrations. Part VI--Computer-Aided Electron Optics: Numerical Calculation of Trajectories, Paraxial Properties and Aberrations. The Use of Computer Algebra Languages. Notes and References. Index.
- Part VII--Instrumental Optics: Electrostatic Lenses. Magnetic Lenses. Electron Mirrors. Cathode Lenses and Field-Emission Microscopy. Quadrupole Lenses. Deflection Systems. Part VII--Aberration Correction and Beam Intensity Distribution (Caustics): Aberration Correction. Caustics and their Applications. Part IX--Electron Guns: General Features of Electron Guns. Theory of Electron Emission. Pointed Cathodes without Space Charge. Space Charge Effects. Brightness. Emittance. The Boersch Effect. Complete Electron Guns. Part X--Systems with a Curved Optic Axis: General Curvilinear Systems. Magnetic Sector Fields. Unified Theories of Ion Optical Systems. Notes and References. Index. Part XI--Wave Mechanics: The Schrodinger Equation. The Relativistic Wave Equation. The Eikonal Approximation. Paraxial Wave Optics. The General Theory of Electron Diffraction and Interference. Elementary Diffraction Patterns. Part XII--Electron Interference and Electron Holography: General Introduction. Principles of Interferometry. Principles of Holography. Part XIII--Theory of Image Formation: General Introduction. Fundamentals of Transfer Theory. The Theory of Bright-field Imaging. Image Formation in the Scanning Transmission Electron Microscope. Part XIV--Electron Interactions in Thin Specimens: Electron Interactions in Amorphous Specimens. Electron Interactions in Crystalline Specimens. Part XV--Digital Image Processing: Introduction. Acquisition, Sampling and Coding. Enhancement. Linear Restoration. Nonlinear Restoration. Three-Dimensional Reconstruction. Image Analysis. Instrument Control and Instrumental Image Manipulation. Part XVI--Coherence, Brightness and Spectral Functions: Coherence and the Brightness Functions. Instrumental Aspects of Coherence. Appendix. Notes and References. Index.