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Practical guide to surface science and spectroscopy /
Practical Guide to Surface Science and Spectroscopy provides a practical introduction to surface science as well as describes the basic analytical techniques that researchers use to understand what occurs at the surfaces of materials and at their interfaces. These techniques include auger electron s...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Diego :
Academic Press,
�2001.
|
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 020 | |z 9780121746100 | ||
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| 100 | 1 | |a Chung, Yip-wah, |d 1950- | |
| 245 | 1 | 0 | |a Practical guide to surface science and spectroscopy / |c Yip-Wah Chung. |
| 246 | 3 | 0 | |a Surface science and spectroscopy |
| 260 | |a San Diego : |b Academic Press, |c �2001. | ||
| 300 | |a 1 online resource (xiii, 186 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a Chapter 1. Fundamental Concepts in Ultrahigh Vacuum, Surface Preparation, and Electron Spectroscopy; Chapter 2. Auger Electron Spectroscopy; Chapter 3. Photoelectron Spectroscopy; Chapter 4. Inelastic Scattering of Electrons and Ions; Chapter 5. Low-Energy Electron Diffraction; Chapter 6. Scanning Probe Microscopy; Chapter 7. Interfacial Segregation; Chapter 8. Metal-Semiconductor Interfaces; Chapter 9. Gas-Surface Interactions. | |
| 520 | |a Practical Guide to Surface Science and Spectroscopy provides a practical introduction to surface science as well as describes the basic analytical techniques that researchers use to understand what occurs at the surfaces of materials and at their interfaces. These techniques include auger electron spectroscopy, photoelectron spectroscopy, inelastic scattering of electrons and ions, low energy electron diffraction, scanning probe microscopy, and interfacial segregation. Understanding the behavior of materials at their surfaces is essential for materials scientists and engineers as they design and fabricate microelectronics and semiconductor devices. | ||
| 650 | 0 | |a Surfaces (Physics) | |
| 650 | 0 | |a Spectrum analysis. | |
| 650 | 2 | |a Spectrum Analysis |0 (DNLM)D013057 | |
| 650 | 6 | |a Surfaces (Physique) |0 (CaQQLa)201-0050017 | |
| 650 | 6 | |a Analyse spectrale. |0 (CaQQLa)201-0018272 | |
| 650 | 7 | |a SCIENCE |x Physics |x Condensed Matter. |2 bisacsh | |
| 650 | 7 | |a Spectrum analysis |2 fast |0 (OCoLC)fst01129108 | |
| 650 | 7 | |a Surfaces (Physics) |2 fast |0 (OCoLC)fst01139265 | |
| 650 | 7 | |a Oberfl�achenphysik |2 gnd |0 (DE-588)4134881-3 | |
| 650 | 7 | |a Spektroskopie |2 gnd |0 (DE-588)4056138-0 | |
| 776 | 0 | 8 | |i Print version: |a Chung, Yip-wah, 1950- |t Practical guide to surface science and spectroscopy. |d San Diego : Academic Press, �2001 |z 0121746100 |z 9780121746100 |w (DLC) 00111108 |w (OCoLC)59403953 |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780121746100 |z Texto completo |