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VLSI test principles and architectures : design for testability /

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of indu...

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Detalles Bibliográficos
Clasificación:	Libro Electrónico
Otros Autores:	Wang, Laung-Terng (Editor ), Wu, Cheng-Wen, EE Ph. D. (Editor ), Wen, Xiaoqing (Editor )
Formato:	Electrónico eBook
Idioma:	Inglés
Publicado:	Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, [2006]
Colección:	Morgan Kaufmann series in systems on silicon.
Temas:	Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design. Integrated circuits > Very large scale integration > Design and construction. Circuits int�egr�es �a tr�es grande �echelle > Essais. Circuits int�egr�es �a tr�es grande �echelle > Conception et construction. TECHNOLOGY & ENGINEERING > Electronics > Circuits > VLSI & ULSI. TECHNOLOGY & ENGINEERING > Electronics > Circuits > Logic. COMPUTERS > Logic Design. Integrated circuits > Very large scale integration > Design and construction Integrated circuits > Very large scale integration > Design Integrated circuits > Very large scale integration > Testing Testen VLSI Circuitos integrados vlsi.
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