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Stress and strain in epitaxy : theoretical concepts, measurements, and applications : keynote lectures of the Third Porquerolles School on Special Topics in Surface Science, Ile de Porquerolles, France, October 1-7, 2000 /
This book contains keynote lectures which have been delivered at the 3rd Porquerolles' School on Surface Science, SIR2000 (Surfaces-Interfaces-Relaxation). The aim of this school was to review the main concepts necessary to understand the role of interfacial stress, strain and relaxation in cry...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor Corporativo: | |
| Otros Autores: | , |
| Formato: | Electrónico Congresos, conferencias eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam ; New York :
Elsevier Science,
2001.
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| Edición: | 1st ed. |
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Introduction
- Some elastic effects in crystal growth
- Introduction to the atomic structure of surfaces: a theoretical point of view
- Dislocations and stress relaxation in heteroepitaxial films
- An atomistic approach for stress relaxation in materials
- Ab initio study of the structural stability of thin films
- Stress, strain and chemical reactivity: A theoretical analysis
- Strain measurements in ultra-thin films using RHEED and X-ray techniques
- Measurement of displacement and strain by high-resolution transmission electron microscopy
- Stess measurements of atomic layers and at surfaces
- STM spectroscopy on semiconductors
- Spatially resolved surface spectroscopy.