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Structural and residual stress analysis by nondestructive methods : evaluation, application, assessment /
The field of stress analysis has gained its momentum from the widespread applications in industry and technology and has now become an important part of materials science. Various destructive as well as nondestructive methods have been developed for the determination of stresses. This timely book pr...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam ; New York :
Elsevier,
1997.
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| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 100 | 1 | |a Hauk, V. |q (Viktor) | |
| 245 | 1 | 0 | |a Structural and residual stress analysis by nondestructive methods : |b evaluation, application, assessment / |c Viktor Hauk ; contributions by H. Behnken [and others]. |
| 260 | |a Amsterdam ; |a New York : |b Elsevier, |c 1997. | ||
| 300 | |a 1 online resource (xiv, 640 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
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| 520 | |a The field of stress analysis has gained its momentum from the widespread applications in industry and technology and has now become an important part of materials science. Various destructive as well as nondestructive methods have been developed for the determination of stresses. This timely book provides a comprehensive review of the nondestructive techniques for strain evaluation written by experts in their respective fields. The main part of the book deals with X-ray stress analysis (XSA), focussing on measurement and evaluation methods which can help to solve the problems of today, the numerous applications of metallic, polymeric and ceramic materials as well as of thin-film-substrate composites and of advanced microcomponents. Furthermore it contains data, results, hints and recommendations that are valuable to laboratories for the certification and accreditation of their stress analysis. Stress analysis is an active field in which many questions remain unsettled. Accordingly, unsolved problems and conflicting results are discussed as well. The assessment of the experimentally determined residual and structural stress states on the static and dynamic behavior of materials and components is handled in a separate chapter. Students and engineers of materials science and scientists working in laboratories and industries will find this book invaluable. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a Cover -- Contents -- Preface -- Chapter 1. Introduction -- 1.1 Existing literature -- 1.2 Significance of structural and residual stress analysis for materials science and technology -- 1.3 Characteristics of different methods of evaluating structural-load stresses (LS) and residual stresses (RS) -- 1.4 References -- Chapter 2. X-ray diffraction -- 2.01 Highlights in the history of diffraction methods-first notice, entire treatment -- 2.02 Symbols and abbreviations -- 2.03 Some basic relations to the stress analysis using diffraction methods (H. Behnken) -- 2.04 Lattice strain measuring techniques -- 2.05 Stationary and mobile X-ray equipment (W. Pfeiffer) -- 2.06 Definition of macro- and microstresses and their separation -- 2.07 Evaluation of LS and RS -- 2.08 Peak width and its relation to different parameters -- 2.09 Stacking faults (W. Reimers) -- 2.10 Recommendations for strain measurement and stress evaluation -- 2.11 Determination of the lattice distance of the strain-stress-free state D0 and the relation with the stress component in the -- 2.12 Strains and stresses in the phases of dual- / multiphase and of heterogeneous materials -- 2.13 X-ray elastic constants (XEC) -- 2.14 Shear components -- 2.15 The evaluation of strain-, stress- and D0-profiles or gradients with the depth from the surface -- 2.16 Residual stresses after plastic deformation of mechanically isotropic and of textured materials -- 2.17 Line broadening by non-oriented micro RS (Ch. Genzel) -- 2.18 Residual stress analysis in single crystallites (W. Reimers) -- Chapter 3. Neutron diffraction methods -- 3.1 Historical review -- 3.2 Principles -- 3.3 Instruments for stress measurements -- 3.4 Data evaluation procedures -- 3.5 Fields of application -- 3.6 Possible hazards -- 3.7 Neutron diffraction versus x-ray diffraction and other techniques -- 3.8 Recommendations -- 3.9 References -- Chapter 4. Ultrasonic techniques -- 4.01 Historical review -- 4.02 Symbols and abbreviations -- 4.03 Physical fundamentals -- 4.04 Measuring systems and setups for specific applications -- 4.05 Evaluation of stress states in metallic components -- 4.06 Recommendations -- 4.07 References -- Chapter 5. Micromagnetie techniques -- 5.01 Historical review -- 5.02 Symbols and abbreviations -- 5.03 Physical fundamentals -- 5.04 Micromagnetic residual stress measurements -- 5.05 Recommendations -- 5.06 References -- Chapter 6. Assessment of residual stresses -- 6.01 Historical review -- 6.02 General remarks -- 6.03 Residual stress effects on components under static loads -- 6.04 Residual stress effects on components under fatigue loading -- 6.05 Residual stresses and failure analysis -- 6.06 Recommendations -- 6.07 References -- Subject index -- Last Page. | |
| 650 | 0 | |a Residual stresses. | |
| 650 | 0 | |a Nondestructive testing. | |
| 650 | 6 | |a Contraintes r�esiduelles. |0 (CaQQLa)201-0039288 | |
| 650 | 6 | |a Contr�ole non destructif. |0 (CaQQLa)201-0017832 | |
| 650 | 7 | |a internal stress. |2 aat |0 (CStmoGRI)aat300228369 | |
| 650 | 7 | |a nondestructive testing. |2 aat |0 (CStmoGRI)aat300225748 | |
| 650 | 7 | |a SCIENCE |x Nanoscience. |2 bisacsh | |
| 650 | 7 | |a Nondestructive testing |2 fast |0 (OCoLC)fst01430903 | |
| 650 | 7 | |a Residual stresses |2 fast |0 (OCoLC)fst01095565 | |
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| 650 | 7 | |a Contraintes r�esiduelles. |2 ram | |
| 700 | 1 | |a Behnken, H. |q (Herfried) | |
| 776 | 0 | 8 | |i Print version: |a Hauk, V. (Viktor). |t Structural and residual stress analysis by nondestructive methods. |d Amsterdam ; New York : Elsevier, 1997 |z 0444824766 |z 9780444824769 |w (DLC) 97040004 |w (OCoLC)37606368 |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780444824769 |z Texto completo |