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Waveguide spectroscopy of thin films /
In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in t...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam :
Elsevier,
2005.
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| Edición: | 1st ed. |
| Colección: | Thin films and nanostructures ;
v. 33. |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo |
| Sumario: | In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties. There are new techniques of measurement of thin-film parameters stated. |
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| Descripción Física: | 1 online resource (xv, 220 pages) : illustrations |
| Bibliografía: | Includes bibliographical references (pages 207-217) and index. |
| ISBN: | 9780120885152 0120885158 0080457894 9780080457895 |