Optical diagnostics for thin film processing /

This volume describes the increasing role of in situ optical diagnostics in thin film processing for applications ranging from fundamental science studies to process development to control during manufacturing. The key advantage of optical diagnostics in these applications is that they are usually n...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Herman, Irving P.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Diego, CA : Academic Press, �1996.
Temas:
Thin films > Surfaces.
Spectrum analysis > Industrial applications.
Couches minces > Surfaces.
TECHNOLOGY & ENGINEERING > Electronics > Solid State.
TECHNOLOGY & ENGINEERING > Electronics > Semiconductors.
D�unne Schicht
Optische Eigenschaft
Spectroscopie > Applications industrielles.
Spectroscopie.
Thin films
Acceso en línea:Texto completo

Internet

Texto completo

Items no disponibles

Detalle de Existencias desde

Ejemplares similares