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Reliability and failure of electronic materials and devices /

Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Ohring, Milton, 1936-
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Diego : Academic Press, �1998.
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • An Overview of Electronic Devices and Their Reliability. Electronic Devices: How They Operate and Are Fabricated. Defects, Contaminants, and Yield. The Mathematics of Failure and Reliability. Mass Transport-Induced Failure. Electronic Charge-Induced Damage. Environmental Damage to Electronic Products. Packaging Materials, Processes and Stresses. Degradation of Contacts and Package Interconnections. Degradation and Failure of Electro-Optical Materials and Devices. Characterization and Failure Analysis of Materials and Devices. Future Directions and Reliability Issues.