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Advances in imaging and electron physics. Volume 142 /
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Diego :
Academic Press,
�2006.
|
| Colección: | Advances in imaging and electron physics ;
v. 142. |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 245 | 0 | 0 | |a Advances in imaging and electron physics. |n Volume 142 / |c edited by Peter W. Hawkes ; [associate editors Benjamin Kazan, Tom Mulvey]. |
| 260 | |a San Diego : |b Academic Press, |c �2006. | ||
| 300 | |a 1 online resource (xiv, 336 pages) : |b illustrations. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Advances in imaging and electron physics ; |v v. 142 | |
| 504 | |a Includes bibliographical references and index. | ||
| 520 | |a Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a Contributors; Preface; Future Contributions; Conservative Optical Logic Devices: COLD; Introduction; A Short Overview of Conservative Logic; Logics for Optics; Interferometers for Special Conservative Optical Logic Operations; Toward an All-Passive NOR Gate; The Mach-Zehnder Interferometer as an Optically Controllable Digital Light Deflector; Multiple COLD Chips; Advantages Achieved by COLD; Conclusions; Appendix A; References; Advanced Neutron Imaging and Sensing; Introduction; Neutron Optics: Experimental Interferometry; Neutron Optics: Basic Concepts. | |
| 650 | 0 | |a Electrons. | |
| 650 | 0 | |a Electron microscopes. | |
| 650 | 0 | |a Microscopy. | |
| 650 | 0 | |a Image processing. | |
| 650 | 2 | |a Electrons |0 (DNLM)D004583 | |
| 650 | 2 | |a Microscopy |0 (DNLM)D008853 | |
| 650 | 6 | |a �Electrons. |0 (CaQQLa)201-0004714 | |
| 650 | 6 | |a Microscopes �electroniques. |0 (CaQQLa)201-0014917 | |
| 650 | 6 | |a Microscopie. |0 (CaQQLa)201-0055735 | |
| 650 | 6 | |a Traitement d'images. |0 (CaQQLa)201-0029952 | |
| 650 | 7 | |a microscopy. |2 aat |0 (CStmoGRI)aat300054100 | |
| 650 | 7 | |a image processing. |2 aat |0 (CStmoGRI)aat300237864 | |
| 650 | 7 | |a SCIENCE |x Physics |x Electromagnetism. |2 bisacsh | |
| 650 | 7 | |a SCIENCE |x Physics |x Electricity. |2 bisacsh | |
| 650 | 7 | |a Electron microscopes |2 fast |0 (OCoLC)fst00906679 | |
| 650 | 7 | |a Electrons |2 fast |0 (OCoLC)fst00907642 | |
| 650 | 7 | |a Image processing |2 fast |0 (OCoLC)fst00967501 | |
| 650 | 7 | |a Microscopy |2 fast |0 (OCoLC)fst01020062 | |
| 700 | 1 | |a Hawkes, P. W. | |
| 700 | 1 | |a Kazan, Benjamin. | |
| 700 | 1 | |a Mulvey, Thomas. | |
| 776 | 0 | 8 | |i Print version: |t Advances in imaging and electron physics. Volume 142. |d San Diego : Academic Press, �2006 |z 012014784X |w (OCoLC)71063026 |
| 830 | 0 | |a Advances in imaging and electron physics ; |v v. 142. | |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780120147847 |z Texto completo |