Advances in imaging and electron physics. Volume 142 /

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W., Kazan, Benjamin, Mulvey, Thomas
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Diego : Academic Press, �2006.
Colección:Advances in imaging and electron physics ; v. 142.
Temas:
Electrons.
Electron microscopes.
Microscopy.
Image processing.
Electrons
Microscopy
�Electrons.
Microscopes �electroniques.
Microscopie.
Traitement d'images.
microscopy.
image processing.
SCIENCE > Physics > Electromagnetism.
SCIENCE > Physics > Electricity.
Electron microscopes
Image processing
Acceso en línea:Texto completo
Descripción
Sumario:Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Descripción Física:1 online resource (xiv, 336 pages) : illustrations.
Bibliografía:Includes bibliographical references and index.
ISBN:0080462839
9780080462837
012014784X
9780120147847

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