Advances in imaging and electron physics. Volume 134 /

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam ; Boston : Elsevier Academic Press, �2005.
Colección:Advances in imaging and electron physics ; 134.
Temas:
Image processing.
X-ray crystallography.
Fractals.
Multisensor data fusion.
Crystallography, X-Ray
Traitement d'images.
Radiocristallographie.
Fractales.
Fusion multicapteurs.
image processing.
fractals.
SCIENCE > Physics > Electromagnetism.
SCIENCE > Physics > Electricity.
Acceso en línea:Texto completo
Descripción
Sumario:Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Descripción Física:1 online resource (xvi, 276 pages) : illustrations.
Bibliografía:Includes bibliographical references and index.
ISBN:0080458408
9780080458403
0120147769
9780120147762
ISSN:1076-5670 ;

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