Advances in imaging and electron physics. Volume 136 /

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W. (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam ; Boston : Elsevier Academic Press, �2005.
Colección:Advances in imaging and electron physics ; 136.
Temas:
Image processing.
Electron microscopy.
Traitement d'images.
Microscopie �electronique.
image processing.
electron microscopy.
SCIENCE > Physics > Electromagnetism.
SCIENCE > Physics > Electricity.
Electron microscopy
Image processing
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Front cover; copyright; table of contents; front matter; Contributors; Preface; Future Contributions; body; Real and Complex PDE-Based Schemes for Image Sharpening and Enhancement; The S-State Model for Electron Channeling in High-Resolution Electron Microscopy; Measurement of Electric Fields on Object Surface in an Emission Electron Microscope; Index.

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