Advances in imaging and electron physics. Volume 135 /

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam ; Boston : Elsevier Academic Press, �2005.
Colección:Advances in imaging and electron physics ; 135.
Temas:
Image processing.
Atomic force microscopy.
Spectrum analysis.
Cyclostationary waves.
Semiconductor lasers.
Traitement d'images.
Microscopie �a force atomique.
Ondes cyclostationnaires.
Lasers �a semi-conducteurs.
image processing.
SCIENCE > Physics > Electromagnetism.
SCIENCE > Physics > Electricity.
Atomic force microscopy
Cyclostationary waves
Image processing
Semiconductor lasers
Spectrum analysis
Acceso en línea:Texto completo
Descripción
Sumario:Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Descripción Física:1 online resource (xv, 347 pages) : illustrations.
Bibliografía:Includes bibliographical references and index.
ISBN:0080458548
9780080458540
0120147777
9780120147779
ISSN:1076-5670 ;

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