Tabla de Contenidos:
  • Chapter 1: Light Sources; Chapter 2: Lenses, Prisms, and Mirrors; Chapter 3: Optoelectronic Sensors; Chapter 4: Optical Devices and Optomechanical Elements; Chapter 5: Propagation of Light; Chapter 6: Interferometry; Chapter 7: Holography; Chapter 8: Speckle Methods and Applications; Chapter 9: Moir©♭ Metrology; Chapter 10: Optical Heterodyne Measurement Method; Chapter 11: Diffraction; Chapter 12: Light Scattering; Chapter 13: Polarization; Chapter 14: Near-Field Optics.
  • Chapter 15: Length and SizeChapter 16: Displacement; Chapter 17: Straightness and Alignment; Chapter 18: Flatness; Chapter 19: Surface Profilometry; Chapter 20: Three-Dimensional Shape Measurement; Chapter 21: Fringe Analysis; Chapter 22: Photogrammetry; Chapter 23: Optical Methods in Solid Mechanics; Chapter 24: Optical Methods in Flow Measurement; Chapter 25: Polarimetry; Chapter 26: Birefringence Measurement; Chapter 27: Ellipsometry; Chapter 28: Optical Thin Film and Coatings; Chapter 29: Film Surface and Thickness Profilometry.
  • Chapter 30: Optical Coherence Tomography for Industrial ApplicationsChapter 31: Interference Microscopy for Surface Structure Analysis; Chapter 32: Noncontact Dimensional and Profile Metrology by Video Measurement; Chapter 33: Optical Metrology in Manufacturing Technology; Chapter 34: On-Machine Measurements.