Fundamental principles of engineering nanometrology /
Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rig...
Clasificación: | Libro Electrónico |
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Autor principal: | Leach, R. K. (Autor) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Oxford, OX :
Elsevier, William Andrew,
2014.
|
Edición: | Second edition. |
Colección: | Micro & nano technologies.
|
Temas: | |
Acceso en línea: | Texto completo (Requiere registro previo con correo institucional) |
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