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Fundamental principles of engineering nanometrology /

Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rig...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Leach, R. K. (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Oxford, OX : Elsevier, William Andrew, 2014.
Edición:Second edition.
Colección:Micro & nano technologies.
Temas:
Acceso en línea:Texto completo (Requiere registro previo con correo institucional)
Descripción
Sumario:Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale, from the fundamentals of precision measurement, to different measurement and characterization techniques. This book is an essential guide for the emerging nanomanufacturing and nanofabrication sectors, where measurement and standardiza.
Descripción Física:1 online resource (384 pages)
Bibliografía:Includes bibliographical references and index.
ISBN:9781455777501
1455777501