X-ray diffraction : modern experimental techniques /

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern sy...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Seeck, Oliver H., 1966- (Editor ), Murphy, Bridget M., 1969- (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: [Singapore] : Pan Stanford Publishing, [2014]
Temas:
X-rays > Diffraction.
Radiography, Industrial.
Nanostructured materials > Analysis.
Rayons X > Diffraction.
Radiographie industrielle.
Nanomatériaux > Analyse.
x-ray diffraction.
TECHNOLOGY & ENGINEERING > Engineering (General)
TECHNOLOGY & ENGINEERING > Reference.
Acceso en línea:Texto completo (Requiere registro previo con correo institucional)

Internet

Texto completo (Requiere registro previo con correo institucional)

Items no disponibles

Detalle de Existencias desde

Ejemplares similares