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X-ray diffraction : modern experimental techniques /

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern sy...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Seeck, Oliver H., 1966- (Editor ), Murphy, Bridget M., 1969- (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: [Singapore] : Pan Stanford Publishing, [2014]
Temas:
Acceso en línea:Texto completo (Requiere registro previo con correo institucional)
Descripción
Sumario:High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments.
Descripción Física:1 online resource (xv, 427 pages) : illustrations (chiefly color)
Bibliografía:Includes bibliographical references and index.
ISBN:9789814303606
9814303607