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Semiconductor x-ray detectors /

Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Lowe, B. G. (Autor), Sareen, R. A. (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boca Raton, FL : CRC Press, [2014]
Colección:Sensors series.
Temas:
Acceso en línea:Texto completo (Requiere registro previo con correo institucional)
Tabla de Contenidos:
  • Chapter 1. Introduction
  • chapter 2. Detector response function
  • chapter 3. Detector artefacts
  • chapter 4. Contacts
  • chapter 5. Si(Li) x-ray detectors
  • chapter 6. HPSi and HPGe x-ray detectors
  • chapter 7. X-ray detectors based on silicon lithography and planar technology
  • chapter 8. CCD-based x-ray detectors
  • chapter 9. Silicon drift x-ray detectors
  • chapter 10. Wide bandgap semiconductors
  • chapter 11. History of semiconductor x-ray detectors and their applications.