Semiconductor x-ray detectors /
Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium...
Clasificación: | Libro Electrónico |
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Autores principales: | Lowe, B. G. (Autor), Sareen, R. A. (Autor) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Boca Raton, FL :
CRC Press,
[2014]
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Colección: | Sensors series.
|
Temas: | |
Acceso en línea: | Texto completo (Requiere registro previo con correo institucional) |
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