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Semiconductor x-ray detectors /
Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium...
| Clasificación: | Libro Electrónico |
|---|---|
| Autores principales: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Boca Raton, FL :
CRC Press,
[2014]
|
| Colección: | Sensors series.
|
| Temas: | |
| Acceso en línea: | Texto completo (Requiere registro previo con correo institucional) |
MARC
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| 100 | 1 | |a Lowe, B. G., |e author. | |
| 245 | 1 | 0 | |a Semiconductor x-ray detectors / |c B.G. Lowe, R.A. Sareen. |
| 264 | 1 | |a Boca Raton, FL : |b CRC Press, |c [2014] | |
| 264 | 4 | |c ©20 | |
| 264 | 4 | |c ©2014 | |
| 300 | |a 1 online resource : |b text file, PDF | ||
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| 490 | 1 | |a Series in sensors | |
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Chapter 1. Introduction -- chapter 2. Detector response function -- chapter 3. Detector artefacts -- chapter 4. Contacts -- chapter 5. Si(Li) x-ray detectors -- chapter 6. HPSi and HPGe x-ray detectors -- chapter 7. X-ray detectors based on silicon lithography and planar technology -- chapter 8. CCD-based x-ray detectors -- chapter 9. Silicon drift x-ray detectors -- chapter 10. Wide bandgap semiconductors -- chapter 11. History of semiconductor x-ray detectors and their applications. | |
| 520 | |a Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its good resolution and peak to background, pioneered this type of analysis on electron microscopes, x-ray fluorescence instruments, and radioactive source- and accelerator-based excitation systems. Although rapid progress in Silicon Drift Detectors (SD. | ||
| 590 | |a O'Reilly |b O'Reilly Online Learning: Academic/Public Library Edition | ||
| 650 | 0 | |a Semiconductors. | |
| 650 | 0 | |a X-rays. | |
| 650 | 2 | |a Semiconductors | |
| 650 | 2 | |a X-Rays | |
| 650 | 6 | |a Semi-conducteurs. | |
| 650 | 6 | |a Rayons X. | |
| 650 | 7 | |a semiconductor. |2 aat | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Mechanical. |2 bisacsh | |
| 650 | 7 | |a Semiconductors. |2 fast |0 (OCoLC)fst01112198 | |
| 650 | 7 | |a X-rays. |2 fast |0 (OCoLC)fst01181857 | |
| 700 | 1 | |a Sareen, R. A., |e author. | |
| 776 | 0 | 8 | |i Print version: |a Lowe, B.G. |t Semiconductor X-Ray Detectors. |d Hoboken : Taylor and Francis, ©2013 |z 9781466554009 |
| 830 | 0 | |a Sensors series. | |
| 856 | 4 | 0 | |u https://learning.oreilly.com/library/view/~/9781466554016/?ar |z Texto completo (Requiere registro previo con correo institucional) |
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