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Combined analysis /

This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Chateigner, Daniel
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London, UK : Hoboken, NJ : ISTE ; Wiley, 2010.
Temas:
Acceso en línea:Texto completo (Requiere registro previo con correo institucional)
Descripción
Sumario:This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models.
Descripción Física:1 online resource (xviii, 497 pages) : illustrations
Bibliografía:Includes bibliographical references and index.
ISBN:1299315550
9781299315556
9781118622643
1118622642
1848211988
9781848211988
9781118622711
1118622715