Built-in test for VLSI : pseudorandom techniques /

This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has trea...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Bardell, Paul H.
Otros Autores: McAnney, William H., Savir, Jacob
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York : Wiley, ©1987.
Temas:
Integrated circuits > Very large scale integration > Testing.
Circuits intégrés à très grande échelle > Essais.
Integrated circuits > Very large scale integration > Testing
Electrical & Computer Engineering.
Engineering & Applied Sciences.
Electrical Engineering.
Electronic equipment > Very large scale integrated circuits > Testing
Acceso en línea:Texto completo (Requiere registro previo con correo institucional)
Tabla de Contenidos:
  • Digital testing and the need for testable design
  • Principles of testable design
  • Pseudorandom sequence generators
  • Test response compression techniques
  • Shift-register polynomial division
  • Special-purpose shift-register circuits
  • Random pattern built-in test
  • Built-in test structures
  • Limitations and other concerns of random pattern testing
  • Test system requirements for built-in test
  • Appendix
  • References
  • Index.

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