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Built-in test for VLSI : pseudorandom techniques /
This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has trea...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York :
Wiley,
©1987.
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| Temas: | |
| Acceso en línea: | Texto completo (Requiere registro previo con correo institucional) |