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Electronic design automation : synthesis, verification, and test /

This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Wang, Laung-Terng, Chang, Yao-Wen, Cheng, Kwang-Ting, 1961-
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Burlington, MA : Morgan Kaufmann Publishers/Elsevier, 2009.
Colección:Morgan Kaufmann series in systems on silicon.
Temas:
Acceso en línea:Texto completo (Requiere registro previo con correo institucional)
Tabla de Contenidos:
  • Ch. 1. Introduction / Charles E. Stroud, Lang-Terng Wang and Yao-Wen Chang
  • Ch. 2. Fundamentals of CMOS design / Xinghao Chen and Nur A. Touba
  • Ch. 3. Design for testability / Laung-Terng Wang
  • Ch. 4. Fundamentals of algorithms / Chung-Yang Huang, Chao-Yue Lai and Kwang-Ting Cheng
  • Ch. 5. Electronic system-level design and high-level synthesis / Jianwen Zhu and Nikil Dutt
  • Ch. 6. Logic synthesis in a nutshell / Jie-Hong Jiang and Srinivas Devadas
  • Ch. 7. Test synthesis / Laung-Terng Wang, Xiaoqing Wen and Shianling Wu
  • Ch. 8. Logic and circuit simulation / Jiun-Lang Huang, Cheng-Kok Koh and Stephen F. Cauley
  • Ch. 9. Functional verification / Hung-Pin Wen, Li-C. Wang and Kwang-Ting Cheng
  • Ch. 10. Floorplanning / Tung-Chieh Chen and Yao-Wen Chang
  • Ch. 11. Placement / Chris Chu
  • Ch. 12. Global and detailed routing / Huang-Yu Chen and Yao-Wen Chang
  • Ch. 13. Synthesis of clock ad power/ground networks / Cheng-Kok Koh, Jitesh Jain and Stephen F. Cauley.
  • Ch. 14. Fault Simulation and Test Generation / James C.-M. Li and Michael S. Hsiao.